Abstract
We review the topic of self-assembled endotaxial silicide nanowires on silicon. Crystallographic orientation, lattice mismatch and average dimensions are discussed for a variety of systems including Ti, Mn, Fe, Co, Ni, Pt and several rare earths on Si(100), Si(111) and Si(110) surfaces. In situ observations of growth dynamics support a constant-shape growth model, in which length, width and thickness all change in proportion as the nanowire grows, with thermally activated, facet-dependent rates.
Original language | English (US) |
---|---|
Pages (from-to) | 8434-8440 |
Number of pages | 7 |
Journal | Thin Solid Films |
Volume | 519 |
Issue number | 24 |
DOIs | |
State | Published - Oct 3 2011 |
Keywords
- Endotaxy
- Epitaxy
- Nanowire
- Silicide
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Surfaces and Interfaces
- Surfaces, Coatings and Films
- Metals and Alloys
- Materials Chemistry