Elimination of thickness dependence from medium resolution electron holograms

M. Gajdardziska-Josifovska, Martha McCartney

Research output: Contribution to journalArticlepeer-review

18 Scopus citations

Abstract

We show that a composition image that is independent of thickness can be obtained by suitably combining the phase and amplitude images extracted from an off-axis electron hologram. This image is the product of the mean inner potential of the material and the mean-free-path for inelastic scattering. The method used has been evaluated using single crystal Si wedges with known linearly increasing thickness, and it has then been applied to CoSi2/Si epitaxial interfaces with unknown thickness. Thickness independent images of Si show constant contrast while images of hetero interface emphasize compositional differences.

Original languageEnglish (US)
Pages (from-to)291-296
Number of pages6
JournalUltramicroscopy
Volume53
Issue number3
DOIs
StatePublished - Mar 1994

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Instrumentation

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