Elimination of parasitic effects in floating junction rear surface passivation for solar cells

Christiana Honsberg, S. B. Ghozati, A. U. Ebong, Y. H. Tang, S. R. Wenham

Research output: Chapter in Book/Report/Conference proceedingConference contribution

15 Citations (Scopus)

Abstract

Floating junction (FJ) passivation is a relatively recent passivation scheme which has both experimentally and theoretically demonstrated superior passivation than either oxide or back surface field passivation [1][2][3][4]. In addition, it is suited not only to high efficiency laboratory cells, but also to commercial solar cells. The improvement in surface passivation for commercial cells is an especially critical issue in achieving lower cost solar cells through reducing substrate thickness while simultaneously increasing efficiency [5]. Despite the many advantages of FJ passivation, its applicability has been limited by the seeming inability to translate the excellent modelling results into actual solar cells. The objective of this paper is to present a complete analysis of FJ passivation and to demonstrate a method by which the problems with FJ passivation can be eliminated. Experimental evidence as well as theoretical modelling demonstrates that a solar cell with an optimized rear FJ is insensitive to parasitic effects.

Original languageEnglish (US)
Title of host publicationConference Record of the IEEE Photovoltaic Specialists Conference
Editors Anon
Pages401-404
Number of pages4
StatePublished - 1996
Externally publishedYes
EventProceedings of the 1996 25th IEEE Photovoltaic Specialists Conference - Washington, DC, USA
Duration: May 13 1996May 17 1996

Other

OtherProceedings of the 1996 25th IEEE Photovoltaic Specialists Conference
CityWashington, DC, USA
Period5/13/965/17/96

Fingerprint

Passivation
floating
passivity
elimination
Solar cells
solar cells
cells
Oxides
oxides
Substrates
Costs

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Control and Systems Engineering

Cite this

Honsberg, C., Ghozati, S. B., Ebong, A. U., Tang, Y. H., & Wenham, S. R. (1996). Elimination of parasitic effects in floating junction rear surface passivation for solar cells. In Anon (Ed.), Conference Record of the IEEE Photovoltaic Specialists Conference (pp. 401-404)

Elimination of parasitic effects in floating junction rear surface passivation for solar cells. / Honsberg, Christiana; Ghozati, S. B.; Ebong, A. U.; Tang, Y. H.; Wenham, S. R.

Conference Record of the IEEE Photovoltaic Specialists Conference. ed. / Anon. 1996. p. 401-404.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Honsberg, C, Ghozati, SB, Ebong, AU, Tang, YH & Wenham, SR 1996, Elimination of parasitic effects in floating junction rear surface passivation for solar cells. in Anon (ed.), Conference Record of the IEEE Photovoltaic Specialists Conference. pp. 401-404, Proceedings of the 1996 25th IEEE Photovoltaic Specialists Conference, Washington, DC, USA, 5/13/96.
Honsberg C, Ghozati SB, Ebong AU, Tang YH, Wenham SR. Elimination of parasitic effects in floating junction rear surface passivation for solar cells. In Anon, editor, Conference Record of the IEEE Photovoltaic Specialists Conference. 1996. p. 401-404
Honsberg, Christiana ; Ghozati, S. B. ; Ebong, A. U. ; Tang, Y. H. ; Wenham, S. R. / Elimination of parasitic effects in floating junction rear surface passivation for solar cells. Conference Record of the IEEE Photovoltaic Specialists Conference. editor / Anon. 1996. pp. 401-404
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