@inproceedings{46a3b431c3c44aef89a7754f9ed04486,
title = "Elimination of artifacts in external quantum efficiency measurements for multijunction solar cells using a pulsed light bias",
abstract = "A method using a pulsed light bias synchronized to the probing monochromatic light and superimposed on the conventional dc light and voltage biases is proposed to eliminate the artifacts in external quantum efficiency (EQE) measurements for multijunction solar cells. It is demonstrated experimentally that this method effectively eliminates the EQE measurement artifacts caused by the shunt effect, the luminescence coupling effect, or their combination.",
keywords = "External quantum efficiency, luminescence coupling, measurement artifacts, multijunction solar cell, pulsed light bias, shunt",
author = "Li, {Jing Jing} and Yong-Hang Zhang",
year = "2012",
month = dec,
day = "1",
language = "English (US)",
isbn = "9781467328883",
series = "Conference Record of the IEEE Photovoltaic Specialists Conference",
number = "PART 2",
booktitle = "2012 IEEE 38th Photovoltaic Specialists Conference, PVSC 2012",
edition = "PART 2",
note = "2012 IEEE 38th Photovoltaic Specialists Conference, PVSC 2012 ; Conference date: 03-06-2012 Through 08-06-2012",
}