Elimination of artifacts in external quantum efficiency measurements for multijunction solar cells using a pulsed light bias

Jing Jing Li, Yong-Hang Zhang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

A method using a pulsed light bias synchronized to the probing monochromatic light and superimposed on the conventional dc light and voltage biases is proposed to eliminate the artifacts in external quantum efficiency (EQE) measurements for multijunction solar cells. It is demonstrated experimentally that this method effectively eliminates the EQE measurement artifacts caused by the shunt effect, the luminescence coupling effect, or their combination.

Original languageEnglish (US)
Title of host publication2012 IEEE 38th Photovoltaic Specialists Conference, PVSC 2012
EditionPART 2
StatePublished - Dec 1 2012
Event2012 IEEE 38th Photovoltaic Specialists Conference, PVSC 2012 - Austin, TX, United States
Duration: Jun 3 2012Jun 8 2012

Publication series

NameConference Record of the IEEE Photovoltaic Specialists Conference
NumberPART 2
ISSN (Print)0160-8371

Other

Other2012 IEEE 38th Photovoltaic Specialists Conference, PVSC 2012
CountryUnited States
CityAustin, TX
Period6/3/126/8/12

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Keywords

  • External quantum efficiency
  • luminescence coupling
  • measurement artifacts
  • multijunction solar cell
  • pulsed light bias
  • shunt

ASJC Scopus subject areas

  • Control and Systems Engineering
  • Industrial and Manufacturing Engineering
  • Electrical and Electronic Engineering

Cite this

Li, J. J., & Zhang, Y-H. (2012). Elimination of artifacts in external quantum efficiency measurements for multijunction solar cells using a pulsed light bias. In 2012 IEEE 38th Photovoltaic Specialists Conference, PVSC 2012 (PART 2 ed.). [2216512] (Conference Record of the IEEE Photovoltaic Specialists Conference; No. PART 2).