13 Scopus citations

Abstract

A method using a pulsed light bias synchronized to the probing monochromatic light and superimposed on the conventional dc light and voltage biases is proposed to eliminate the artifacts in external quantum efficiency (EQE) measurements for multijunction solar cells. It is demonstrated experimentally that this method effectively eliminates the EQE measurement artifacts caused by the shunt effect, the luminescence coupling effect, or their combination.

Original languageEnglish (US)
Article number6353868
Pages (from-to)364-369
Number of pages6
JournalIEEE Journal of Photovoltaics
Volume3
Issue number1
DOIs
StatePublished - 2013

Keywords

  • External quantum efficiency
  • luminescence coupling
  • measurement artifacts
  • multijunction solar cell
  • pulsed light bias
  • shunt

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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