Electron waveguide transmission resonance at a defect

A. M. Kriman, B. S. Haukness, D. K. Ferry

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

We study theoretically the effect of few elastic scatterers on electron transport in the ballistic regime. In laterally confined structures (quasi 1-d or 2-d), resonant transmission peaks occur when total electron energy equals any miniband energy. Unit transmission probability is approached when the scattering defect is small, and far from other scatterers, even if the scatterer is strong enough to decrease significantly the conductance away from resonance. Both numerical and analytical methods are used. Resonance occur for all shapes of confining potential.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
EditorsMurray J. Gibson, Harold G. Craighead
Place of PublicationBellingham, WA, United States
PublisherPubl by Int Soc for Optical Engineering
Pages82-90
Number of pages9
Volume1284
ISBN (Print)0819403350
StatePublished - 1990
EventNanostructures and Microstructure Correlation with Physical Properties of Semiconductors - San Diego, CA, USA
Duration: Mar 20 1990Mar 21 1990

Other

OtherNanostructures and Microstructure Correlation with Physical Properties of Semiconductors
CitySan Diego, CA, USA
Period3/20/903/21/90

Fingerprint

Waveguides
waveguides
Defects
Electrons
defects
Ballistics
scattering
electrons
Scattering
confining
ballistics
electron energy
Electron Transport
energy

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

Cite this

Kriman, A. M., Haukness, B. S., & Ferry, D. K. (1990). Electron waveguide transmission resonance at a defect. In M. J. Gibson, & H. G. Craighead (Eds.), Proceedings of SPIE - The International Society for Optical Engineering (Vol. 1284, pp. 82-90). Bellingham, WA, United States: Publ by Int Soc for Optical Engineering.

Electron waveguide transmission resonance at a defect. / Kriman, A. M.; Haukness, B. S.; Ferry, D. K.

Proceedings of SPIE - The International Society for Optical Engineering. ed. / Murray J. Gibson; Harold G. Craighead. Vol. 1284 Bellingham, WA, United States : Publ by Int Soc for Optical Engineering, 1990. p. 82-90.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Kriman, AM, Haukness, BS & Ferry, DK 1990, Electron waveguide transmission resonance at a defect. in MJ Gibson & HG Craighead (eds), Proceedings of SPIE - The International Society for Optical Engineering. vol. 1284, Publ by Int Soc for Optical Engineering, Bellingham, WA, United States, pp. 82-90, Nanostructures and Microstructure Correlation with Physical Properties of Semiconductors, San Diego, CA, USA, 3/20/90.
Kriman AM, Haukness BS, Ferry DK. Electron waveguide transmission resonance at a defect. In Gibson MJ, Craighead HG, editors, Proceedings of SPIE - The International Society for Optical Engineering. Vol. 1284. Bellingham, WA, United States: Publ by Int Soc for Optical Engineering. 1990. p. 82-90
Kriman, A. M. ; Haukness, B. S. ; Ferry, D. K. / Electron waveguide transmission resonance at a defect. Proceedings of SPIE - The International Society for Optical Engineering. editor / Murray J. Gibson ; Harold G. Craighead. Vol. 1284 Bellingham, WA, United States : Publ by Int Soc for Optical Engineering, 1990. pp. 82-90
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