Electron speckle and higher-order correlation functions from amorphous thin films

Murray J. Gibson, Michael Treacy, D. Loretto

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

We obtain valuable information about medium-range order in amorphous semiconductors from variable coherence microscopy, a new quantitative approach to TEM. The technique reveals three-body and higher-order atomic correlation functions, which are sensitive to medium-range order. Preliminary experimental evidence for structural changes on annealing has been found for amorphous semiconductor films, with pronounced medium-range order seen only in unannealed films.

Original languageEnglish (US)
Title of host publicationMaterials Research Society Symposium - Proceedings
EditorsW.J. Gray, I.R. Triay
PublisherMaterials Research Society
Pages349-356
Number of pages8
Volume455
StatePublished - 1997
Externally publishedYes
EventProceedings of the 1996 MRS Fall Meeting - Boston, MA, USA
Duration: Dec 2 1996Dec 6 1996

Other

OtherProceedings of the 1996 MRS Fall Meeting
CityBoston, MA, USA
Period12/2/9612/6/96

Fingerprint

Amorphous semiconductors
Amorphous films
Speckle
Thin films
Electrons
Microscopic examination
Annealing
Transmission electron microscopy

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials

Cite this

Gibson, M. J., Treacy, M., & Loretto, D. (1997). Electron speckle and higher-order correlation functions from amorphous thin films. In W. J. Gray, & I. R. Triay (Eds.), Materials Research Society Symposium - Proceedings (Vol. 455, pp. 349-356). Materials Research Society.

Electron speckle and higher-order correlation functions from amorphous thin films. / Gibson, Murray J.; Treacy, Michael; Loretto, D.

Materials Research Society Symposium - Proceedings. ed. / W.J. Gray; I.R. Triay. Vol. 455 Materials Research Society, 1997. p. 349-356.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Gibson, MJ, Treacy, M & Loretto, D 1997, Electron speckle and higher-order correlation functions from amorphous thin films. in WJ Gray & IR Triay (eds), Materials Research Society Symposium - Proceedings. vol. 455, Materials Research Society, pp. 349-356, Proceedings of the 1996 MRS Fall Meeting, Boston, MA, USA, 12/2/96.
Gibson MJ, Treacy M, Loretto D. Electron speckle and higher-order correlation functions from amorphous thin films. In Gray WJ, Triay IR, editors, Materials Research Society Symposium - Proceedings. Vol. 455. Materials Research Society. 1997. p. 349-356
Gibson, Murray J. ; Treacy, Michael ; Loretto, D. / Electron speckle and higher-order correlation functions from amorphous thin films. Materials Research Society Symposium - Proceedings. editor / W.J. Gray ; I.R. Triay. Vol. 455 Materials Research Society, 1997. pp. 349-356
@inproceedings{9885d0619d0043e1b227a8538c6bbcdf,
title = "Electron speckle and higher-order correlation functions from amorphous thin films",
abstract = "We obtain valuable information about medium-range order in amorphous semiconductors from variable coherence microscopy, a new quantitative approach to TEM. The technique reveals three-body and higher-order atomic correlation functions, which are sensitive to medium-range order. Preliminary experimental evidence for structural changes on annealing has been found for amorphous semiconductor films, with pronounced medium-range order seen only in unannealed films.",
author = "Gibson, {Murray J.} and Michael Treacy and D. Loretto",
year = "1997",
language = "English (US)",
volume = "455",
pages = "349--356",
editor = "W.J. Gray and I.R. Triay",
booktitle = "Materials Research Society Symposium - Proceedings",
publisher = "Materials Research Society",

}

TY - GEN

T1 - Electron speckle and higher-order correlation functions from amorphous thin films

AU - Gibson, Murray J.

AU - Treacy, Michael

AU - Loretto, D.

PY - 1997

Y1 - 1997

N2 - We obtain valuable information about medium-range order in amorphous semiconductors from variable coherence microscopy, a new quantitative approach to TEM. The technique reveals three-body and higher-order atomic correlation functions, which are sensitive to medium-range order. Preliminary experimental evidence for structural changes on annealing has been found for amorphous semiconductor films, with pronounced medium-range order seen only in unannealed films.

AB - We obtain valuable information about medium-range order in amorphous semiconductors from variable coherence microscopy, a new quantitative approach to TEM. The technique reveals three-body and higher-order atomic correlation functions, which are sensitive to medium-range order. Preliminary experimental evidence for structural changes on annealing has been found for amorphous semiconductor films, with pronounced medium-range order seen only in unannealed films.

UR - http://www.scopus.com/inward/record.url?scp=0030674593&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0030674593&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:0030674593

VL - 455

SP - 349

EP - 356

BT - Materials Research Society Symposium - Proceedings

A2 - Gray, W.J.

A2 - Triay, I.R.

PB - Materials Research Society

ER -