Electron speckle and higher-order correlation functions from amorphous thin films

Murray J. Gibson, Michael Treacy, D. Loretto

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations

Abstract

We obtain valuable information about medium-range order in amorphous semiconductors from variable coherence microscopy, a new quantitative approach to TEM. The technique reveals three-body and higher-order atomic correlation functions, which are sensitive to medium-range order. Preliminary experimental evidence for structural changes on annealing has been found for amorphous semiconductor films, with pronounced medium-range order seen only in unannealed films.

Original languageEnglish (US)
Title of host publicationMaterials Research Society Symposium - Proceedings
EditorsW.J. Gray, I.R. Triay
PublisherMaterials Research Society
Pages349-356
Number of pages8
Volume455
StatePublished - 1997
Externally publishedYes
EventProceedings of the 1996 MRS Fall Meeting - Boston, MA, USA
Duration: Dec 2 1996Dec 6 1996

Other

OtherProceedings of the 1996 MRS Fall Meeting
CityBoston, MA, USA
Period12/2/9612/6/96

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ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials

Cite this

Gibson, M. J., Treacy, M., & Loretto, D. (1997). Electron speckle and higher-order correlation functions from amorphous thin films. In W. J. Gray, & I. R. Triay (Eds.), Materials Research Society Symposium - Proceedings (Vol. 455, pp. 349-356). Materials Research Society.