Electron source brightness and degeneracy from Fresnel fringes in field emission point projection microscopy

John Spence; W. Qian; M. P. Silverman

doi:10.1116/1.579166

Electron source brightness and degeneracy from Fresnel fringes in field emission point projection microscopy

John Spence, W. Qian, M. P. Silverman

Physics

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79 Scopus citations

Abstract

Fresnel edge fringes observed in a lensless point projection field-emission electron microscope operating at 90 eV have been studied and found to be formally equivalent to the fringes observed in transmission electron microscopy (TEM) under weak scattering conditions at the edge of an opaque object. The tip-to-spectrum distance z₁ plays the role of the objective lens defocus setting Δf in conventional TEM. The image magnification, effective source size, transverse coherence width, instrumental resolution, and source brightness are all obtained from an analysis of the fringe spacings and intensity. The quantum mechanical upper limit on source brightness, as well as relationships among beam brightness, coherence parameters, and degeneracy, are discussed, and the degeneracy measured from experimental Fresnel fringes.

Original language	English (US)
Pages (from-to)	542-547
Number of pages	6
Journal	Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Volume	12
Issue number	2
DOIs	https://doi.org/10.1116/1.579166
State	Published - Mar 1994

ASJC Scopus subject areas

Condensed Matter Physics
Surfaces and Interfaces
Surfaces, Coatings and Films

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AB - Fresnel edge fringes observed in a lensless point projection field-emission electron microscope operating at 90 eV have been studied and found to be formally equivalent to the fringes observed in transmission electron microscopy (TEM) under weak scattering conditions at the edge of an opaque object. The tip-to-spectrum distance z1 plays the role of the objective lens defocus setting Δf in conventional TEM. The image magnification, effective source size, transverse coherence width, instrumental resolution, and source brightness are all obtained from an analysis of the fringe spacings and intensity. The quantum mechanical upper limit on source brightness, as well as relationships among beam brightness, coherence parameters, and degeneracy, are discussed, and the degeneracy measured from experimental Fresnel fringes.

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Electron source brightness and degeneracy from Fresnel fringes in field emission point projection microscopy

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