Abstract
Joule heating measurements are carried out over a wide range of temperatures on a two-dimensional electron gas fabricated in an In 0.52Al0.48As/In0.53Ga0.47As/In 0.52Al0.48As heterostructure system that has a 25 nm wide In0.53Ga0.47As quantum well region. The energy loss rate is observed to be an indicator of the electron-phonon coupling processes in these systems. The temperature dependence of the energy loss rate is studied from 30 mK to 30 K and points toward a possible dominant unscreened piezoelectric coupling to the acoustic modes over temperatures of 1-30 K, with boundary scattering in the ohmic contacts gaining importance at very low temperatures. The temperature decay of the energy relaxation time exhibits a T-3 behavior at high temperatures that transitions to a T -1 at lower temperatures and tends to saturation at millikelvin levels.
Original language | English (US) |
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Pages (from-to) | 215-220 |
Number of pages | 6 |
Journal | Physica E: Low-Dimensional Systems and Nanostructures |
Volume | 19 |
Issue number | 1-2 |
DOIs | |
State | Published - Jul 2003 |
Event | Fourth International Symposium on Nanostructures and Mesoscopi - Tempe, AZ, United States Duration: Feb 17 2003 → Feb 21 2003 |
Keywords
- Energy relaxation
- Hot carriers
- InA1As
- InGaAs
- Joule heating
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics
- Condensed Matter Physics