TY - JOUR
T1 - Electron microscopy studies of epitaxial MgB2 superconducting thin films grown by in situ reactive evaporation
AU - Gu, Lin
AU - Moeckly, Brian H.
AU - Smith, David
N1 - Copyright:
Copyright 2008 Elsevier B.V., All rights reserved.
PY - 2005/7/1
Y1 - 2005/7/1
N2 - The morphology and chemistry of epitaxial MgB2 thin films grown using reactive Mg evaporation on different substrates have been characterized by transmission electron microscopy methods. For polycrystalline alumina and sapphire substrates with different surface planes, an MgO transition layer was found at the interface region. No such layer was present for films grown on MgO and 4-H SiC substrates, and none of the MgB2 films had any detectable oxygen incorporation nor MgO inclusions. High-resolution electron microscopy revealed that the growth orientation of the MgB2 thin films was closely related to the substrate orientation and the nature of the intermediary layer. Electrical measurements showed that very low resistivities (several μΩ cm at 300 K) and high superconducting transition temperatures (38 to 40 K) could be achieved. The correlation of electrical properties with film microstructure is briefly discussed.
AB - The morphology and chemistry of epitaxial MgB2 thin films grown using reactive Mg evaporation on different substrates have been characterized by transmission electron microscopy methods. For polycrystalline alumina and sapphire substrates with different surface planes, an MgO transition layer was found at the interface region. No such layer was present for films grown on MgO and 4-H SiC substrates, and none of the MgB2 films had any detectable oxygen incorporation nor MgO inclusions. High-resolution electron microscopy revealed that the growth orientation of the MgB2 thin films was closely related to the substrate orientation and the nature of the intermediary layer. Electrical measurements showed that very low resistivities (several μΩ cm at 300 K) and high superconducting transition temperatures (38 to 40 K) could be achieved. The correlation of electrical properties with film microstructure is briefly discussed.
KW - A1. Characterization
KW - A1. Crystal morphology
KW - B2. Superconducting materials
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U2 - 10.1016/j.jcrysgro.2005.03.066
DO - 10.1016/j.jcrysgro.2005.03.066
M3 - Article
AN - SCOPUS:20344392454
SN - 0022-0248
VL - 280
SP - 602
EP - 611
JO - Journal of Crystal Growth
JF - Journal of Crystal Growth
IS - 3-4
ER -