Electron microscopy of surface-crater defects on HgCdTe/CdZnTe(211)B epilayers grown by molecular-beam epitaxy

Engineering & Materials Science

• Epilayers 100%
• Molecular beam epitaxy 90%
• Electron microscopy 76%
• Surface defects 70%
• High resolution electron microscopy 49%
• High resolution transmission electron microscopy 47%
• Defects 40%
• Atomic force microscopy 37%
• Grain boundaries 29%
• Scanning 22%
• Substrates 20%

Physics & Astronomy

• craters 66%
• electron microscopy 50%
• molecular beam epitaxy 49%
• high resolution 35%
• defects 32%
• voids 17%
• occurrences 15%
• inclusions 15%
• atomic force microscopy 14%
• grain boundaries 14%
• transmission electron microscopy 12%
• scanning 12%

Chemical Compounds

• Molecular Beam Epitaxy 84%
• Electron Microscopy 51%
• Grain Boundary 30%
• Polycrystalline Solid 26%
• Atomic Force Microscopy 23%
• Alloy 20%
• Surface 9%