ELECTRON MICROSCOPY OF Se-IMPLANTED AND ELECTRON-BEAM ANNEALED GaAs.

N. J. Shah, H. Ahmed, L. A. Freeman, David Smith

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations
Original languageEnglish (US)
Title of host publicationInstitute of Physics Conference Series
Place of PublicationBristol, Engl
PublisherInst of Physics
Pages125-130
Number of pages6
Edition67
ISBN (Print)0854981586
Publication statusPublished - 1983
Externally publishedYes

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ASJC Scopus subject areas

  • Engineering(all)

Cite this

Shah, N. J., Ahmed, H., Freeman, L. A., & Smith, D. (1983). ELECTRON MICROSCOPY OF Se-IMPLANTED AND ELECTRON-BEAM ANNEALED GaAs. In Institute of Physics Conference Series (67 ed., pp. 125-130). Bristol, Engl: Inst of Physics.