ELECTRON MICROSCOPY OF Se-IMPLANTED AND ELECTRON-BEAM ANNEALED GaAs.

N. J. Shah, H. Ahmed, L. A. Freeman, David J. Smith

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations
Original languageEnglish (US)
Title of host publicationInstitute of Physics Conference Series
PublisherInst of Physics
Pages125-130
Number of pages6
Edition67
ISBN (Print)0854981586
StatePublished - 1983
Externally publishedYes

Publication series

NameInstitute of Physics Conference Series
Number67
ISSN (Print)0373-0751

ASJC Scopus subject areas

  • General Physics and Astronomy

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