Electron microscopy characterization of Fe-Ga and Fe-Si-B fine particles

Virgil C. Solomon; David Smith; Jung Il Hong; Ami E. Berkowitz

doi:10.1017/S1431927609097992

Electron microscopy characterization of Fe-Ga and Fe-Si-B fine particles

Virgil C. Solomon, David Smith, Jung Il Hong, Ami E. Berkowitz

Research output: Contribution to journal › Article › peer-review

Original language	English (US)
Pages (from-to)	112-113
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	15
Issue number	SUPPL. 2
DOIs	https://doi.org/10.1017/S1431927609097992
State	Published - Jul 2009

ASJC Scopus subject areas

Instrumentation

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title = "Electron microscopy characterization of Fe-Ga and Fe-Si-B fine particles",

author = "Solomon, {Virgil C.} and David Smith and Hong, {Jung Il} and Berkowitz, {Ami E.}",

year = "2009",

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language = "English (US)",

volume = "15",

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journal = "Microscopy and Microanalysis",

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AU - Solomon, Virgil C.

AU - Smith, David

AU - Hong, Jung Il

AU - Berkowitz, Ami E.

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SP - 112

EP - 113

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - SUPPL. 2

ER -

Electron microscopy characterization of Fe-Ga and Fe-Si-B fine particles

ASJC Scopus subject areas

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