Electron microscopy characterization of Fe-Ga and Fe-Si-B fine particles

Virgil C. Solomon, David Smith, Jung Il Hong, Ami E. Berkowitz

Research output: Contribution to journalArticle

Original languageEnglish (US)
Pages (from-to)112-113
Number of pages2
JournalMicroscopy and Microanalysis
Issue numberSUPPL. 2
StatePublished - Jul 1 2009

ASJC Scopus subject areas

  • Instrumentation

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