Electron microscopy characterization of Ba(Cd1/3Ta2/3)O3 microwave dielectrics with boron additive

J. Sun, Shaojun Liu, Nathan Newman, Martha McCartney, David Smith

Research output: Contribution to journalArticlepeer-review

6 Scopus citations

Abstract

The microstructure of Ba(Cd1/3Ta2/3)O3 ceramics with boron additive was investigated by high-resolution and analytical electron microscopy. Superlattice reflections were present at positions of (h ± 1/3, k ± 1/3, 1 ± 1/3) away from the fundamental reflections in the [1??10] zone diffraction pattern for the pseudocubic perovskite unit cell. Lattice images showed a well-ordered structure with hexagonal symmetry. No boron segregation and amorphous phase was observed along grain boundaries. An amorphous phase rich in boron-oxide was observed to form pockets partially penetrating along multiple grain junctions.

Original languageEnglish (US)
Pages (from-to)1387-1391
Number of pages5
JournalJournal of Materials Research
Volume19
Issue number5
DOIs
StatePublished - May 2004

ASJC Scopus subject areas

  • General Materials Science
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

Fingerprint

Dive into the research topics of 'Electron microscopy characterization of Ba(Cd1/3Ta2/3)O3 microwave dielectrics with boron additive'. Together they form a unique fingerprint.

Cite this