Abstract

The microstructure of Ba(Cd1/3Ta2/3)O3 ceramics with boron additive was investigated by high-resolution and analytical electron microscopy. Superlattice reflections were present at positions of (h ± 1/3, k ± 1/3, 1 ± 1/3) away from the fundamental reflections in the [1??10] zone diffraction pattern for the pseudocubic perovskite unit cell. Lattice images showed a well-ordered structure with hexagonal symmetry. No boron segregation and amorphous phase was observed along grain boundaries. An amorphous phase rich in boron-oxide was observed to form pockets partially penetrating along multiple grain junctions.

Original languageEnglish (US)
Pages (from-to)1387-1391
Number of pages5
JournalJournal of Materials Research
Volume19
Issue number5
DOIs
StatePublished - May 2004

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Boron
Electron microscopy
electron microscopy
boron
Microwaves
boron oxides
microwaves
Diffraction patterns
Grain boundaries
diffraction patterns
grain boundaries
ceramics
Perovskite
microstructure
Microstructure
high resolution
symmetry
cells
Oxides
boron oxide

ASJC Scopus subject areas

  • Materials Science(all)

Cite this

Electron microscopy characterization of Ba(Cd1/3Ta2/3)O3 microwave dielectrics with boron additive. / Sun, J.; Liu, Shaojun; Newman, Nathan; McCartney, Martha; Smith, David.

In: Journal of Materials Research, Vol. 19, No. 5, 05.2004, p. 1387-1391.

Research output: Contribution to journalArticle

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