Electron ionization cross sections for atomic subshells

Research output: Contribution to journalArticle

9 Citations (Scopus)

Abstract

Ionization of atoms is the first step in many analytical procedures. The cross section for ionizing a particular atomic shell is essential for calculating the magnitude of analytical signals. Calculations using atomic wave functions for various shells of all elements relevant for X-ray microanalysis over a range of electron energies up to 400 keV were performed. The calculations for high energies above threshold can be considerably simplified by using the mathematical form of the Bethe ridge that dominates the scattering in this region. Corrections for exchange at low energies above threshold are incorporated in these calculations. A selection of results showing the effects of different approximations on ionization cross sections for K, L, and M shells is presented.

Original languageEnglish (US)
Pages (from-to)42-53
Number of pages12
JournalMicroscopy and Microanalysis
Volume9
Issue number1
DOIs
StatePublished - Feb 2003

Fingerprint

ionization cross sections
Ionization
ionization
Electrons
thresholds
microanalysis
ridges
Microanalysis
Wave functions
wave functions
electron energy
energy
cross sections
Scattering
approximation
scattering
X rays
Atoms
atoms
x rays

Keywords

  • Analytical electron microscopy
  • Cross sections
  • Electron ionization

ASJC Scopus subject areas

  • Instrumentation

Cite this

Electron ionization cross sections for atomic subshells. / Rez, Peter.

In: Microscopy and Microanalysis, Vol. 9, No. 1, 02.2003, p. 42-53.

Research output: Contribution to journalArticle

@article{4b56075cab83469084a34e1d310e7605,
title = "Electron ionization cross sections for atomic subshells",
abstract = "Ionization of atoms is the first step in many analytical procedures. The cross section for ionizing a particular atomic shell is essential for calculating the magnitude of analytical signals. Calculations using atomic wave functions for various shells of all elements relevant for X-ray microanalysis over a range of electron energies up to 400 keV were performed. The calculations for high energies above threshold can be considerably simplified by using the mathematical form of the Bethe ridge that dominates the scattering in this region. Corrections for exchange at low energies above threshold are incorporated in these calculations. A selection of results showing the effects of different approximations on ionization cross sections for K, L, and M shells is presented.",
keywords = "Analytical electron microscopy, Cross sections, Electron ionization",
author = "Peter Rez",
year = "2003",
month = "2",
doi = "10.1017/S1431927603030083",
language = "English (US)",
volume = "9",
pages = "42--53",
journal = "Microscopy and Microanalysis",
issn = "1431-9276",
publisher = "Cambridge University Press",
number = "1",

}

TY - JOUR

T1 - Electron ionization cross sections for atomic subshells

AU - Rez, Peter

PY - 2003/2

Y1 - 2003/2

N2 - Ionization of atoms is the first step in many analytical procedures. The cross section for ionizing a particular atomic shell is essential for calculating the magnitude of analytical signals. Calculations using atomic wave functions for various shells of all elements relevant for X-ray microanalysis over a range of electron energies up to 400 keV were performed. The calculations for high energies above threshold can be considerably simplified by using the mathematical form of the Bethe ridge that dominates the scattering in this region. Corrections for exchange at low energies above threshold are incorporated in these calculations. A selection of results showing the effects of different approximations on ionization cross sections for K, L, and M shells is presented.

AB - Ionization of atoms is the first step in many analytical procedures. The cross section for ionizing a particular atomic shell is essential for calculating the magnitude of analytical signals. Calculations using atomic wave functions for various shells of all elements relevant for X-ray microanalysis over a range of electron energies up to 400 keV were performed. The calculations for high energies above threshold can be considerably simplified by using the mathematical form of the Bethe ridge that dominates the scattering in this region. Corrections for exchange at low energies above threshold are incorporated in these calculations. A selection of results showing the effects of different approximations on ionization cross sections for K, L, and M shells is presented.

KW - Analytical electron microscopy

KW - Cross sections

KW - Electron ionization

UR - http://www.scopus.com/inward/record.url?scp=0037325911&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0037325911&partnerID=8YFLogxK

U2 - 10.1017/S1431927603030083

DO - 10.1017/S1431927603030083

M3 - Article

C2 - 12597786

AN - SCOPUS:0037325911

VL - 9

SP - 42

EP - 53

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

SN - 1431-9276

IS - 1

ER -