Electron energy-loss spectroscopy in irradiation-sensitive rutile-GeO2

Nan Jiang, John Spence

Research output: Contribution to journalArticlepeer-review

2 Scopus citations

Abstract

This report suggests that an electron energy-loss spectroscopy technique under low beam intensity is useful for beam-sensitive materials. High quality 'damage-free' Ge M45 edge near-edge structure can be obtained using this method in rutile-GeO2, which is susceptible to high-energy electron beam damage. Both experimental and theoretical results indicate that the Ge M45 edge ELNES can be used to distinguish fourfold and sixfold coordinated Ge.

Original languageEnglish (US)
Pages (from-to)2813-2816
Number of pages4
JournalJournal of Non-Crystalline Solids
Volume353
Issue number29
DOIs
StatePublished - Sep 15 2007

Keywords

  • STEM/TEM
  • Short-range order
  • TEM/STEM

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Ceramics and Composites
  • Condensed Matter Physics
  • Materials Chemistry

Fingerprint Dive into the research topics of 'Electron energy-loss spectroscopy in irradiation-sensitive rutile-GeO<sub>2</sub>'. Together they form a unique fingerprint.

Cite this