Electron energy-loss spectroscopy in irradiation-sensitive rutile-GeO2

Nan Jiang, John Spence

Research output: Contribution to journalArticle

2 Scopus citations

Abstract

This report suggests that an electron energy-loss spectroscopy technique under low beam intensity is useful for beam-sensitive materials. High quality 'damage-free' Ge M45 edge near-edge structure can be obtained using this method in rutile-GeO2, which is susceptible to high-energy electron beam damage. Both experimental and theoretical results indicate that the Ge M45 edge ELNES can be used to distinguish fourfold and sixfold coordinated Ge.

Original languageEnglish (US)
Pages (from-to)2813-2816
Number of pages4
JournalJournal of Non-Crystalline Solids
Volume353
Issue number29
DOIs
Publication statusPublished - Sep 15 2007

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Keywords

  • Short-range order
  • STEM/TEM
  • TEM/STEM

ASJC Scopus subject areas

  • Ceramics and Composites
  • Electronic, Optical and Magnetic Materials

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