Electron energy-loss spectroscopy and chemical change

R. F. Egerton; P. A. Crozier; P. Rice

doi:10.1016/0304-3991(87)90240-3

Electron energy-loss spectroscopy and chemical change

R. F. Egerton, P. A. Crozier, P. Rice

Research output: Contribution to journal › Article › peer-review

83 Scopus citations

Abstract

Electron energy-loss spectroscopy provides a sensitive in situ method of studying beam-induced changes in the overall chemical composition of a thin specimen. Light-element concentrations can be monitored using the appropriate inner-shell ionization edges; free-electron metals can be identified from their plasmon-loss spectrum. Electron irradiation causes mass loss due to bond scission, radiolysis or surface sputtering, depending on the type of specimen. However, mass loss can often be reduced by cooling the specimen and/or the use of surface coatings.

Original language	English (US)
Pages (from-to)	305-312
Number of pages	8
Journal	Ultramicroscopy
Volume	23
Issue number	3-4
DOIs	https://doi.org/10.1016/0304-3991(87)90240-3
State	Published - 1987
Externally published	Yes

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Atomic and Molecular Physics, and Optics
Instrumentation

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10.1016/0304-3991(87)90240-3

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title = "Electron energy-loss spectroscopy and chemical change",

abstract = "Electron energy-loss spectroscopy provides a sensitive in situ method of studying beam-induced changes in the overall chemical composition of a thin specimen. Light-element concentrations can be monitored using the appropriate inner-shell ionization edges; free-electron metals can be identified from their plasmon-loss spectrum. Electron irradiation causes mass loss due to bond scission, radiolysis or surface sputtering, depending on the type of specimen. However, mass loss can often be reduced by cooling the specimen and/or the use of surface coatings.",

author = "Egerton, {R. F.} and Crozier, {P. A.} and P. Rice",

note = "Funding Information: We thank the Natural Sciences and En gineering Research Council of Canada for support of analytical electron microscopy at the University of Alberta.",

year = "1987",

doi = "10.1016/0304-3991(87)90240-3",

language = "English (US)",

volume = "23",

pages = "305--312",

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T1 - Electron energy-loss spectroscopy and chemical change

AU - Egerton, R. F.

AU - Crozier, P. A.

AU - Rice, P.

N1 - Funding Information: We thank the Natural Sciences and En gineering Research Council of Canada for support of analytical electron microscopy at the University of Alberta.

PY - 1987

Y1 - 1987

N2 - Electron energy-loss spectroscopy provides a sensitive in situ method of studying beam-induced changes in the overall chemical composition of a thin specimen. Light-element concentrations can be monitored using the appropriate inner-shell ionization edges; free-electron metals can be identified from their plasmon-loss spectrum. Electron irradiation causes mass loss due to bond scission, radiolysis or surface sputtering, depending on the type of specimen. However, mass loss can often be reduced by cooling the specimen and/or the use of surface coatings.

AB - Electron energy-loss spectroscopy provides a sensitive in situ method of studying beam-induced changes in the overall chemical composition of a thin specimen. Light-element concentrations can be monitored using the appropriate inner-shell ionization edges; free-electron metals can be identified from their plasmon-loss spectrum. Electron irradiation causes mass loss due to bond scission, radiolysis or surface sputtering, depending on the type of specimen. However, mass loss can often be reduced by cooling the specimen and/or the use of surface coatings.

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U2 - 10.1016/0304-3991(87)90240-3

DO - 10.1016/0304-3991(87)90240-3

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SP - 305

EP - 312

JO - Ultramicroscopy

JF - Ultramicroscopy

IS - 3-4

ER -

Electron energy-loss spectroscopy and chemical change

Abstract

ASJC Scopus subject areas

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