Electron emission measurements from CVD diamond surfaces

S. P. Bozeman; P. K. Baumann; B. L. Ward; M. J. Powers; J. J. Cuomo; R. J. Nemanich; D. L. Dreifus

doi:10.1016/0925-9635(95)00417-3

Electron emission measurements from CVD diamond surfaces

S. P. Bozeman, P. K. Baumann, B. L. Ward, M. J. Powers, J. J. Cuomo, R. J. Nemanich, D. L. Dreifus

Research output: Contribution to journal › Article › peer-review

37 Scopus citations

Abstract

Electron emission measurements on diamond films synthesized by chemical vapor deposition are reported. UV photoemission spectroscopy indicates that the samples exhibit a negative electron affinity after exposure to hydrogen plasma. Secondary electron emission yields vary from 2.2 to 9.2. Field emission current-voltage measurements indicate threshold voltages ranging from 28 to 84 V μm^-1. The film with the highest secondary yield also exhibits the lowest emission threshold.

Original language	English (US)
Pages (from-to)	802-806
Number of pages	5
Journal	Diamond and Related Materials
Volume	5
Issue number	6-8
DOIs	https://doi.org/10.1016/0925-9635(95)00417-3
State	Published - May 1996
Externally published	Yes

Keywords

CVD diamond
Field emission
Secondary electron yield
UV photoelectron spectroscopy

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
General Chemistry
Mechanical Engineering
Materials Chemistry
Electrical and Electronic Engineering
General Physics and Astronomy

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10.1016/0925-9635(95)00417-3

Cite this

@article{314a9d89d2d248e985a04bbef15f447a,

title = "Electron emission measurements from CVD diamond surfaces",

abstract = "Electron emission measurements on diamond films synthesized by chemical vapor deposition are reported. UV photoemission spectroscopy indicates that the samples exhibit a negative electron affinity after exposure to hydrogen plasma. Secondary electron emission yields vary from 2.2 to 9.2. Field emission current-voltage measurements indicate threshold voltages ranging from 28 to 84 V μm-1. The film with the highest secondary yield also exhibits the lowest emission threshold.",

keywords = "CVD diamond, Field emission, Secondary electron yield, UV photoelectron spectroscopy",

author = "Bozeman, {S. P.} and Baumann, {P. K.} and Ward, {B. L.} and Powers, {M. J.} and Cuomo, {J. J.} and Nemanich, {R. J.} and Dreifus, {D. L.}",

note = "Funding Information: This study was partially supportedb y the Office of Naval ResearchT. he authorsa re gratefult o L.S. Plano for supplyingt he diamondf ilms.",

year = "1996",

month = may,

doi = "10.1016/0925-9635(95)00417-3",

language = "English (US)",

volume = "5",

pages = "802--806",

journal = "Diamond and Related Materials",

issn = "0925-9635",

publisher = "Elsevier BV",

number = "6-8",

}

TY - JOUR

T1 - Electron emission measurements from CVD diamond surfaces

AU - Bozeman, S. P.

AU - Baumann, P. K.

AU - Ward, B. L.

AU - Powers, M. J.

AU - Cuomo, J. J.

AU - Nemanich, R. J.

AU - Dreifus, D. L.

N1 - Funding Information: This study was partially supportedb y the Office of Naval ResearchT. he authorsa re gratefult o L.S. Plano for supplyingt he diamondf ilms.

PY - 1996/5

Y1 - 1996/5

N2 - Electron emission measurements on diamond films synthesized by chemical vapor deposition are reported. UV photoemission spectroscopy indicates that the samples exhibit a negative electron affinity after exposure to hydrogen plasma. Secondary electron emission yields vary from 2.2 to 9.2. Field emission current-voltage measurements indicate threshold voltages ranging from 28 to 84 V μm-1. The film with the highest secondary yield also exhibits the lowest emission threshold.

AB - Electron emission measurements on diamond films synthesized by chemical vapor deposition are reported. UV photoemission spectroscopy indicates that the samples exhibit a negative electron affinity after exposure to hydrogen plasma. Secondary electron emission yields vary from 2.2 to 9.2. Field emission current-voltage measurements indicate threshold voltages ranging from 28 to 84 V μm-1. The film with the highest secondary yield also exhibits the lowest emission threshold.

KW - CVD diamond

KW - Field emission

KW - Secondary electron yield

KW - UV photoelectron spectroscopy

UR - http://www.scopus.com/inward/record.url?scp=0043287624&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0043287624&partnerID=8YFLogxK

U2 - 10.1016/0925-9635(95)00417-3

DO - 10.1016/0925-9635(95)00417-3

M3 - Article

AN - SCOPUS:0043287624

SN - 0925-9635

VL - 5

SP - 802

EP - 806

JO - Diamond and Related Materials

JF - Diamond and Related Materials

IS - 6-8

ER -

Electron emission measurements from CVD diamond surfaces

Abstract

Keywords

ASJC Scopus subject areas

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