Electron diffraction in UHV SEM, REM, and TEM

J. A. Venables, C. J. Harland, Peter Bennett, T. E A Zerrouk

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Fingerprint

Dive into the research topics of 'Electron diffraction in UHV SEM, REM, and TEM'. Together they form a unique fingerprint.

Engineering & Materials Science