Electron diffraction from liquids jets in TEM

D. P. Deponte, J. T. McKeown, M. Hunter, R. B. Doak, Uwe Weierstall, John Spence

Research output: Contribution to journalArticle

1 Citation (Scopus)
Original languageEnglish (US)
Pages (from-to)762-763
Number of pages2
JournalMicroscopy and Microanalysis
Volume15
Issue numberSUPPL. 2
DOIs
StatePublished - Jul 2009

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Electron diffraction
electron diffraction
Transmission electron microscopy
transmission electron microscopy
Liquids
liquids

ASJC Scopus subject areas

  • Instrumentation

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Electron diffraction from liquids jets in TEM. / Deponte, D. P.; McKeown, J. T.; Hunter, M.; Doak, R. B.; Weierstall, Uwe; Spence, John.

In: Microscopy and Microanalysis, Vol. 15, No. SUPPL. 2, 07.2009, p. 762-763.

Research output: Contribution to journalArticle

Deponte, DP, McKeown, JT, Hunter, M, Doak, RB, Weierstall, U & Spence, J 2009, 'Electron diffraction from liquids jets in TEM', Microscopy and Microanalysis, vol. 15, no. SUPPL. 2, pp. 762-763. https://doi.org/10.1017/S1431927609092472
Deponte, D. P. ; McKeown, J. T. ; Hunter, M. ; Doak, R. B. ; Weierstall, Uwe ; Spence, John. / Electron diffraction from liquids jets in TEM. In: Microscopy and Microanalysis. 2009 ; Vol. 15, No. SUPPL. 2. pp. 762-763.
@article{560b04d57dd247b39aac620c2195a2b8,
title = "Electron diffraction from liquids jets in TEM",
author = "Deponte, {D. P.} and McKeown, {J. T.} and M. Hunter and Doak, {R. B.} and Uwe Weierstall and John Spence",
year = "2009",
month = "7",
doi = "10.1017/S1431927609092472",
language = "English (US)",
volume = "15",
pages = "762--763",
journal = "Microscopy and Microanalysis",
issn = "1431-9276",
publisher = "Cambridge University Press",
number = "SUPPL. 2",

}

TY - JOUR

T1 - Electron diffraction from liquids jets in TEM

AU - Deponte, D. P.

AU - McKeown, J. T.

AU - Hunter, M.

AU - Doak, R. B.

AU - Weierstall, Uwe

AU - Spence, John

PY - 2009/7

Y1 - 2009/7

UR - http://www.scopus.com/inward/record.url?scp=69949116737&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=69949116737&partnerID=8YFLogxK

U2 - 10.1017/S1431927609092472

DO - 10.1017/S1431927609092472

M3 - Article

AN - SCOPUS:69949116737

VL - 15

SP - 762

EP - 763

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

SN - 1431-9276

IS - SUPPL. 2

ER -