Electron diffraction from liquids jets in TEM

D. P. Deponte, J. T. McKeown, M. Hunter, R. B. Doak, Uwe Weierstall, John Spence

Research output: Contribution to journalArticlepeer-review

1 Scopus citations
Original languageEnglish (US)
Pages (from-to)762-763
Number of pages2
JournalMicroscopy and Microanalysis
Volume15
Issue numberSUPPL. 2
DOIs
StatePublished - Jul 2009

ASJC Scopus subject areas

  • Instrumentation

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