Electron-beam induced amorphization of stishovite: Silicon-coordination change observed using Si K-edge extended electron energy-loss fine structure

Engineering & Materials Science

• Amorphization 80%
• Electron beams 58%
• Electrons 49%
• Energy dissipation 41%
• Silicon 38%
• Quartz 31%
• X ray absorption 24%
• Atoms 14%
• Irradiation 14%
• Electron irradiation 12%
• Electron energy loss spectroscopy 12%
• Multiple scattering 10%
• Vitrification 10%
• Electron diffraction 9%
• Transmission electron microscopy 7%
• Minerals 7%
• Oxygen 5%
• Radiation 5%

Chemical Compounds

• Extended Electron Energy Loss Fine Structure 100%
• Amorphization 61%
• Electron Beam 53%
• Debye-Waller Factor 32%
• Silicon Atom 16%
• Extended X Ray Absorption Fine Structure Spectrum 9%
• Vitrification 9%
• Structure Parameter 8%
• Electron Energy Loss Spectroscopy 8%
• Extended X-Ray Absorption Fine Structure 8%
• Selected Area Electron Diffraction 8%
• Displacement 5%
• Mineral 5%
• Amorphous Material 4%
• Transmission Electron Microscopy 4%
• Environment 3%
• Electron Particle 3%
• Dioxygen 3%
• Amount 3%

Earth & Environmental Sciences

• stishovite 74%
• coordination 45%
• silicon 44%
• electron 34%
• loss 26%
• energy 24%
• quartz 17%
• irradiation 16%
• vitrification 8%
• diffraction 5%
• transmission electron microscopy 5%
• spectroscopy 5%
• scattering 4%
• document 4%
• radiation 4%
• oxygen 3%
• mineral 3%
• calculation 3%
• modeling 2%
• distribution 2%
• parameter 2%
• analysis 1%
• method 1%