Electron and hole partial specific resistances: A framework to understand contacts to solar cells

Arthur Onno, Christopher Chen, Zachary C. Holman

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

In order to understand how contacts influence the performance of solar cells, we previously developed and presented the concept of partial specific resistances: for each contact of a solar cell, we defined voltage-dependent specific resistances to electrons and to holes. Although the connection between these partial specific resistances and the cell performance metrics at open circuit (iVoc and Voc) is straightforward, the relationship becomes more complex when current flows out of the cell, in particular at the maximum power point. In the present work, we investigate the dependence of these hole and electron specific resistances on implied voltage. We show that the shapes of these curves - and not simply the resistance values at the maximum power point, which do not correspond to the same injection level in every cell - dictate the cell efficiency.

Original languageEnglish (US)
Title of host publication2019 IEEE 46th Photovoltaic Specialists Conference, PVSC 2019
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages2329-2333
Number of pages5
ISBN (Electronic)9781728104942
DOIs
StatePublished - Jun 2019
Event46th IEEE Photovoltaic Specialists Conference, PVSC 2019 - Chicago, United States
Duration: Jun 16 2019Jun 21 2019

Publication series

NameConference Record of the IEEE Photovoltaic Specialists Conference
ISSN (Print)0160-8371

Conference

Conference46th IEEE Photovoltaic Specialists Conference, PVSC 2019
CountryUnited States
CityChicago
Period6/16/196/21/19

Keywords

  • carrier-selective contact
  • maximum power point
  • partial specific resistance
  • passivating contact
  • PC1D simulations

ASJC Scopus subject areas

  • Control and Systems Engineering
  • Industrial and Manufacturing Engineering
  • Electrical and Electronic Engineering

Fingerprint Dive into the research topics of 'Electron and hole partial specific resistances: A framework to understand contacts to solar cells'. Together they form a unique fingerprint.

  • Cite this

    Onno, A., Chen, C., & Holman, Z. C. (2019). Electron and hole partial specific resistances: A framework to understand contacts to solar cells. In 2019 IEEE 46th Photovoltaic Specialists Conference, PVSC 2019 (pp. 2329-2333). [8980762] (Conference Record of the IEEE Photovoltaic Specialists Conference). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/PVSC40753.2019.8980762