@inproceedings{6f67a9574cb74327a568b0aadf2c6742,
title = "Electro-thermal modeling of nano-scale devices",
abstract = "In this paper we present simulation results obtained with our electro-thermal device simulator when modeling different technology generations of FD-SOI devices. In particular, we stress out the importance of the temperature boundary conditions for digital and analog circuits and the use of the full model which takes into account both temperature and thickness dependence (which is particularly important for thin silicon films) of the thermal conductivity.",
keywords = "Electro-thermal modeling, FDSOI devices, Particle-based device simulations",
author = "Dragica Vasileska and K. Raleva and Stephen Goodnick",
year = "2009",
language = "English (US)",
isbn = "9782355000102",
series = "15th International Workshop on Thermal Investigations of ICs and Systems, THERMINIC 2009",
pages = "195--196",
booktitle = "15th International Workshop on Thermal Investigations of ICs and Systems, THERMINIC 2009",
note = "15th International Workshop on Thermal Investigations of ICs and Systems, THERMINIC 2009 ; Conference date: 07-10-2009 Through 09-10-2009",
}