Abstract

In this paper we present simulation results obtained with our electro-thermal device simulator when modeling different technology generations of nano-scale fully depleted Silicon-on-Insulator (FD-SOI) devices. The electro-thermal simulator is based on a combined ensemble Monte Carlo device simulator coupled to moment expansion of the phonon Boltzmann transport equations. In particular, we stress out the importance of the temperature boundary conditions for digital and analog circuits and the use of the full model which takes into account both temperature and thickness dependence (which is particularly important for thin silicon films) of the thermal conductivity.

Original languageEnglish (US)
Title of host publication2010 27th International Conference on Microelectronics, MIEL 2010 - Proceedings
Pages395-398
Number of pages4
DOIs
StatePublished - 2010
Event2010 27th International Conference on Microelectronics, MIEL 2010 - Nis, Serbia
Duration: May 16 2010May 19 2010

Other

Other2010 27th International Conference on Microelectronics, MIEL 2010
CountrySerbia
CityNis
Period5/16/105/19/10

Fingerprint

Simulators
Silicon
Digital circuits
Analog circuits
Thermal conductivity
Boundary conditions
Temperature
Hot Temperature

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Cite this

Raleva, K., Vasileska, D., & Goodnick, S. (2010). Electro-thermal modeling of nano-scale devices. In 2010 27th International Conference on Microelectronics, MIEL 2010 - Proceedings (pp. 395-398). [5490455] https://doi.org/10.1109/MIEL.2010.5490455

Electro-thermal modeling of nano-scale devices. / Raleva, K.; Vasileska, Dragica; Goodnick, Stephen.

2010 27th International Conference on Microelectronics, MIEL 2010 - Proceedings. 2010. p. 395-398 5490455.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Raleva, K, Vasileska, D & Goodnick, S 2010, Electro-thermal modeling of nano-scale devices. in 2010 27th International Conference on Microelectronics, MIEL 2010 - Proceedings., 5490455, pp. 395-398, 2010 27th International Conference on Microelectronics, MIEL 2010, Nis, Serbia, 5/16/10. https://doi.org/10.1109/MIEL.2010.5490455
Raleva K, Vasileska D, Goodnick S. Electro-thermal modeling of nano-scale devices. In 2010 27th International Conference on Microelectronics, MIEL 2010 - Proceedings. 2010. p. 395-398. 5490455 https://doi.org/10.1109/MIEL.2010.5490455
Raleva, K. ; Vasileska, Dragica ; Goodnick, Stephen. / Electro-thermal modeling of nano-scale devices. 2010 27th International Conference on Microelectronics, MIEL 2010 - Proceedings. 2010. pp. 395-398
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