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Dive into the research topics of 'ELECTRICAL PROPERTIES AND STRUCTURAL DEFECTS IN EPITAXIAL CaF2 ON Si.'. Together they form a unique fingerprint.- Sort by
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L. J. Schowalter, R. W. Fathauer, F. A. Ponce, G. Anderson, Shin Hashimoto
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution