Electrical measurements of a dithiolated electronic molecule via conducting atomic force microscopy

Adam M. Rawlett, Theresa J. Hopson, Larry A. Nagahara, Raymond K. Tsui, Ganesh K. Ramachandran, Stuart Lindsay

Research output: Contribution to journalArticle

163 Citations (Scopus)

Abstract

We describe a method of measuring the electrical properties of a molecule via conducting atomic force microscopy (AFM). A dithiolated molecule is chemically inserted into defect sites in an insulating self-assembled monolayer formed on an epitaxial Au substrate and the top thiol terminus of the molecule is reacted with a Au nanoparticle. A Au-coated AFM probe is used to contact the molecule through the nanoparticle, thus electrical data can be obtained. We report preliminary transport measurements of two test molecules. Our data shows qualitative agreement with previously published results for similar molecules deposited in a nanopore containing approximately a thousand molecules. This work indicates that the measured negative differential resistance is not an intermolecular phenomenon.

Original languageEnglish (US)
Pages (from-to)3043-3045
Number of pages3
JournalApplied Physics Letters
Volume81
Issue number16
DOIs
StatePublished - Oct 14 2002

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electrical measurement
atomic force microscopy
conduction
electronics
molecules
nanoparticles
thiols
electrical properties
probes
defects

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

Cite this

Electrical measurements of a dithiolated electronic molecule via conducting atomic force microscopy. / Rawlett, Adam M.; Hopson, Theresa J.; Nagahara, Larry A.; Tsui, Raymond K.; Ramachandran, Ganesh K.; Lindsay, Stuart.

In: Applied Physics Letters, Vol. 81, No. 16, 14.10.2002, p. 3043-3045.

Research output: Contribution to journalArticle

Rawlett, Adam M. ; Hopson, Theresa J. ; Nagahara, Larry A. ; Tsui, Raymond K. ; Ramachandran, Ganesh K. ; Lindsay, Stuart. / Electrical measurements of a dithiolated electronic molecule via conducting atomic force microscopy. In: Applied Physics Letters. 2002 ; Vol. 81, No. 16. pp. 3043-3045.
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