Electrical and compositional characterization of gallium grading in Cu(In,Ga)Se2 solar cells

Bradley West, Harvey Guthrey, Lei Chen, April Jeffries, Simone Bernardini, Barry Lai, Jörg Maser, William Shafarman, Mowafak Al-Jasim, Mariana Bertoni

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations

Abstract

Cu(In,Ga)Se2 (CIGS) solar cells were characterized in cross section using electron beam induced current (EBIC) and synchrotron based x-ray fluorescence (XRF) measurements. Samples with varying gallium ratios and growth methods were compared. A correlation was observed between the compositional gallium grading profile from XRF and carrier activity seen in EBIC through the thickness of the CIGS layer. Samples with steep back grading showed carrier activity isolated near the CIGS/CdS interface, whereas a more uniform grading resulted in carrier activity seen throughout the absorber layer. 'Notch' grading showed only slight variation in EBIC profile compared to a back graded sample with similar gallium ratios.

Original languageEnglish (US)
Title of host publication2014 IEEE 40th Photovoltaic Specialist Conference, PVSC 2014
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1726-1728
Number of pages3
ISBN (Electronic)9781479943982
DOIs
StatePublished - Oct 15 2014
Event40th IEEE Photovoltaic Specialist Conference, PVSC 2014 - Denver, United States
Duration: Jun 8 2014Jun 13 2014

Publication series

Name2014 IEEE 40th Photovoltaic Specialist Conference, PVSC 2014

Other

Other40th IEEE Photovoltaic Specialist Conference, PVSC 2014
Country/TerritoryUnited States
CityDenver
Period6/8/146/13/14

Keywords

  • CIGS
  • EBIC
  • band gap grading
  • chalcopyrite
  • synchrotron
  • thin film
  • x-ray fluorescence

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials

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