Electrical and chemical characterization of chemically passivated silicon surfaces

Bhumika Chhabra; Sefik Suzer; Robert L. Opila; Christiana B. Honsberg

doi:10.1109/PVSC.2008.4922673

Electrical and chemical characterization of chemically passivated silicon surfaces

Bhumika Chhabra, Sefik Suzer, Robert L. Opila, Christiana B. Honsberg

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

3 Scopus citations

Abstract

The surface composition of chemically passivated silicon substrates is investigated using XPS and FTIR techniques. The samples are passivated with methanol, quinhydrone-methanol and iodine-methanol solution after HF treatment. The minority carrier lifetimes of these chemically passivated silicon substrates are also measured. Quinhydrone-methanol solution provides a chemically inert surface and a considerably longer minority carrier lifetime.

Original language	English (US)
Title of host publication	33rd IEEE Photovoltaic Specialists Conference, PVSC 2008
DOIs	https://doi.org/10.1109/PVSC.2008.4922673
State	Published - Dec 1 2008
Externally published	Yes
Event	33rd IEEE Photovoltaic Specialists Conference, PVSC 2008 - San Diego, CA, United States Duration: May 11 2008 → May 16 2008

Publication series

Name	Conference Record of the IEEE Photovoltaic Specialists Conference
ISSN (Print)	0160-8371

Other

Other	33rd IEEE Photovoltaic Specialists Conference, PVSC 2008
Country/Territory	United States
City	San Diego, CA
Period	5/11/08 → 5/16/08

ASJC Scopus subject areas

Control and Systems Engineering
Industrial and Manufacturing Engineering
Electrical and Electronic Engineering

Access to Document

10.1109/PVSC.2008.4922673

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Electrical and chemical characterization of chemically passivated silicon surfaces. / Chhabra, Bhumika; Suzer, Sefik; Opila, Robert L. et al.

33rd IEEE Photovoltaic Specialists Conference, PVSC 2008. 2008. 4922673 (Conference Record of the IEEE Photovoltaic Specialists Conference).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Chhabra, B, Suzer, S, Opila, RL & Honsberg, CB 2008, Electrical and chemical characterization of chemically passivated silicon surfaces. in 33rd IEEE Photovoltaic Specialists Conference, PVSC 2008., 4922673, Conference Record of the IEEE Photovoltaic Specialists Conference, 33rd IEEE Photovoltaic Specialists Conference, PVSC 2008, San Diego, CA, United States, 5/11/08. https://doi.org/10.1109/PVSC.2008.4922673

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author = "Bhumika Chhabra and Sefik Suzer and Opila, {Robert L.} and Honsberg, {Christiana B.}",

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AU - Chhabra, Bhumika

AU - Suzer, Sefik

AU - Opila, Robert L.

AU - Honsberg, Christiana B.

PY - 2008/12/1

Y1 - 2008/12/1

N2 - The surface composition of chemically passivated silicon substrates is investigated using XPS and FTIR techniques. The samples are passivated with methanol, quinhydrone-methanol and iodine-methanol solution after HF treatment. The minority carrier lifetimes of these chemically passivated silicon substrates are also measured. Quinhydrone-methanol solution provides a chemically inert surface and a considerably longer minority carrier lifetime.

AB - The surface composition of chemically passivated silicon substrates is investigated using XPS and FTIR techniques. The samples are passivated with methanol, quinhydrone-methanol and iodine-methanol solution after HF treatment. The minority carrier lifetimes of these chemically passivated silicon substrates are also measured. Quinhydrone-methanol solution provides a chemically inert surface and a considerably longer minority carrier lifetime.

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BT - 33rd IEEE Photovoltaic Specialists Conference, PVSC 2008

T2 - 33rd IEEE Photovoltaic Specialists Conference, PVSC 2008

Y2 - 11 May 2008 through 16 May 2008

ER -

Electrical and chemical characterization of chemically passivated silicon surfaces

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