Electric field driven degradation of AlGaN/GaN high electron mobility transistors during off-state stress

C. Y. Chang, E. A. Douglas, J. Kim, L. Liu, C. F. Lo, B. H. Chu, D. J. Cheney, B. P. Gila, F. Ren, G. D. Via, D. A. Cullen, L. Zhou, David Smith, S. Jang, S. J. Pearton

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Fingerprint

Dive into the research topics of 'Electric field driven degradation of AlGaN/GaN high electron mobility transistors during off-state stress'. Together they form a unique fingerprint.

Engineering & Materials Science