ELDRS: Optimization tools for the switched dose rate technique

J. Boch; Y. Gonzalez Velo; F. Saigné; N. J.H. Roche; S. Perez; R. D. Schrimpf; J. R. Vaille; L. Dusseau; J. Mekki; E. Lorfevre; R. Ecoffet

doi:10.1109/TNS.2011.2171003

ELDRS: Optimization tools for the switched dose rate technique

J. Boch, Y. Gonzalez Velo, F. Saigné, N. J.H. Roche, S. Perez, R. D. Schrimpf, J. R. Vaille, L. Dusseau, J. Mekki, E. Lorfevre, R. Ecoffet

Electrical, Computer, and Energy Engineering, School of (IAFSE-ECEE)

Research output: Contribution to journal › Article › peer-review

3 Scopus citations

Abstract

As an accelerated test to characterize bipolar devices, the switched dose rate technique is a suitable solution for obtaining the entire low dose rate curve. Several sets of devices are first irradiated at high dose rate. Subsequently, all the sets are irradiated at low dose rate at the same time, which saves a considerable amount of time. The overall low dose rate curve is reconstructed by translating the individual curves obtained at low dose rate so that they form a continuous curve. The main issue of such a technique is that it requires several sets of devices. In this paper, optimization tools are presented to reduce the number of device sets and guidelines for their use are given.

Original language	English (US)
Article number	6075297
Pages (from-to)	2998-3003
Number of pages	6
Journal	IEEE Transactions on Nuclear Science
Volume	58
Issue number	6 PART 1
DOIs	https://doi.org/10.1109/TNS.2011.2171003
State	Published - Dec 2011

Keywords

Accelerated test method
ELDRS
dose rate
switching experiments
total dose

ASJC Scopus subject areas

Nuclear and High Energy Physics
Nuclear Energy and Engineering
Electrical and Electronic Engineering

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10.1109/TNS.2011.2171003

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title = "ELDRS: Optimization tools for the switched dose rate technique",

abstract = "As an accelerated test to characterize bipolar devices, the switched dose rate technique is a suitable solution for obtaining the entire low dose rate curve. Several sets of devices are first irradiated at high dose rate. Subsequently, all the sets are irradiated at low dose rate at the same time, which saves a considerable amount of time. The overall low dose rate curve is reconstructed by translating the individual curves obtained at low dose rate so that they form a continuous curve. The main issue of such a technique is that it requires several sets of devices. In this paper, optimization tools are presented to reduce the number of device sets and guidelines for their use are given.",

keywords = "Accelerated test method, ELDRS, dose rate, switching experiments, total dose",

author = "J. Boch and {Gonzalez Velo}, Y. and F. Saign{\'e} and Roche, {N. J.H.} and S. Perez and Schrimpf, {R. D.} and Vaille, {J. R.} and L. Dusseau and J. Mekki and E. Lorfevre and R. Ecoffet",

note = "Funding Information: Manuscript received July 21, 2011; revised September 13, 2011, September 15, 2011, and September 19, 2011; accepted September 19, 2011. Date of publication November 10, 2011; date of current version December 14, 2011. This work was supported by the Agence Nationale de la Recherche (ANR-07-JCJC-0152).",

year = "2011",

month = dec,

doi = "10.1109/TNS.2011.2171003",

language = "English (US)",

volume = "58",

pages = "2998--3003",

journal = "IEEE Transactions on Nuclear Science",

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T2 - Optimization tools for the switched dose rate technique

AU - Boch, J.

AU - Gonzalez Velo, Y.

AU - Saigné, F.

AU - Roche, N. J.H.

AU - Perez, S.

AU - Schrimpf, R. D.

AU - Vaille, J. R.

AU - Dusseau, L.

AU - Mekki, J.

AU - Lorfevre, E.

AU - Ecoffet, R.

N1 - Funding Information: Manuscript received July 21, 2011; revised September 13, 2011, September 15, 2011, and September 19, 2011; accepted September 19, 2011. Date of publication November 10, 2011; date of current version December 14, 2011. This work was supported by the Agence Nationale de la Recherche (ANR-07-JCJC-0152).

PY - 2011/12

Y1 - 2011/12

N2 - As an accelerated test to characterize bipolar devices, the switched dose rate technique is a suitable solution for obtaining the entire low dose rate curve. Several sets of devices are first irradiated at high dose rate. Subsequently, all the sets are irradiated at low dose rate at the same time, which saves a considerable amount of time. The overall low dose rate curve is reconstructed by translating the individual curves obtained at low dose rate so that they form a continuous curve. The main issue of such a technique is that it requires several sets of devices. In this paper, optimization tools are presented to reduce the number of device sets and guidelines for their use are given.

AB - As an accelerated test to characterize bipolar devices, the switched dose rate technique is a suitable solution for obtaining the entire low dose rate curve. Several sets of devices are first irradiated at high dose rate. Subsequently, all the sets are irradiated at low dose rate at the same time, which saves a considerable amount of time. The overall low dose rate curve is reconstructed by translating the individual curves obtained at low dose rate so that they form a continuous curve. The main issue of such a technique is that it requires several sets of devices. In this paper, optimization tools are presented to reduce the number of device sets and guidelines for their use are given.

KW - Accelerated test method

KW - ELDRS

KW - dose rate

KW - switching experiments

KW - total dose

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ELDRS: Optimization tools for the switched dose rate technique

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Keywords

ASJC Scopus subject areas

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