ELDRS

Optimization tools for the switched dose rate technique

J. Boch, Yago Gonzalez Velo, F. Saigné, N. J.H. Roche, S. Perez, R. D. Schrimpf, J. R. Vaille, L. Dusseau, J. Mekki, E. Lorfevre, R. Ecoffet

Research output: Contribution to journalArticle

2 Citations (Scopus)

Abstract

As an accelerated test to characterize bipolar devices, the switched dose rate technique is a suitable solution for obtaining the entire low dose rate curve. Several sets of devices are first irradiated at high dose rate. Subsequently, all the sets are irradiated at low dose rate at the same time, which saves a considerable amount of time. The overall low dose rate curve is reconstructed by translating the individual curves obtained at low dose rate so that they form a continuous curve. The main issue of such a technique is that it requires several sets of devices. In this paper, optimization tools are presented to reduce the number of device sets and guidelines for their use are given.

Original languageEnglish (US)
Article number6075297
Pages (from-to)2998-3003
Number of pages6
JournalIEEE Transactions on Nuclear Science
Volume58
Issue number6 PART 1
DOIs
StatePublished - Dec 1 2011
Externally publishedYes

Fingerprint

dosage
optimization
curves
translating

Keywords

  • Accelerated test method
  • dose rate
  • ELDRS
  • switching experiments
  • total dose

ASJC Scopus subject areas

  • Nuclear and High Energy Physics
  • Nuclear Energy and Engineering
  • Electrical and Electronic Engineering

Cite this

Boch, J., Gonzalez Velo, Y., Saigné, F., Roche, N. J. H., Perez, S., Schrimpf, R. D., ... Ecoffet, R. (2011). ELDRS: Optimization tools for the switched dose rate technique. IEEE Transactions on Nuclear Science, 58(6 PART 1), 2998-3003. [6075297]. https://doi.org/10.1109/TNS.2011.2171003

ELDRS : Optimization tools for the switched dose rate technique. / Boch, J.; Gonzalez Velo, Yago; Saigné, F.; Roche, N. J.H.; Perez, S.; Schrimpf, R. D.; Vaille, J. R.; Dusseau, L.; Mekki, J.; Lorfevre, E.; Ecoffet, R.

In: IEEE Transactions on Nuclear Science, Vol. 58, No. 6 PART 1, 6075297, 01.12.2011, p. 2998-3003.

Research output: Contribution to journalArticle

Boch, J, Gonzalez Velo, Y, Saigné, F, Roche, NJH, Perez, S, Schrimpf, RD, Vaille, JR, Dusseau, L, Mekki, J, Lorfevre, E & Ecoffet, R 2011, 'ELDRS: Optimization tools for the switched dose rate technique', IEEE Transactions on Nuclear Science, vol. 58, no. 6 PART 1, 6075297, pp. 2998-3003. https://doi.org/10.1109/TNS.2011.2171003
Boch J, Gonzalez Velo Y, Saigné F, Roche NJH, Perez S, Schrimpf RD et al. ELDRS: Optimization tools for the switched dose rate technique. IEEE Transactions on Nuclear Science. 2011 Dec 1;58(6 PART 1):2998-3003. 6075297. https://doi.org/10.1109/TNS.2011.2171003
Boch, J. ; Gonzalez Velo, Yago ; Saigné, F. ; Roche, N. J.H. ; Perez, S. ; Schrimpf, R. D. ; Vaille, J. R. ; Dusseau, L. ; Mekki, J. ; Lorfevre, E. ; Ecoffet, R. / ELDRS : Optimization tools for the switched dose rate technique. In: IEEE Transactions on Nuclear Science. 2011 ; Vol. 58, No. 6 PART 1. pp. 2998-3003.
@article{e2aab735ff5941c48e1c5f503b658f6b,
title = "ELDRS: Optimization tools for the switched dose rate technique",
abstract = "As an accelerated test to characterize bipolar devices, the switched dose rate technique is a suitable solution for obtaining the entire low dose rate curve. Several sets of devices are first irradiated at high dose rate. Subsequently, all the sets are irradiated at low dose rate at the same time, which saves a considerable amount of time. The overall low dose rate curve is reconstructed by translating the individual curves obtained at low dose rate so that they form a continuous curve. The main issue of such a technique is that it requires several sets of devices. In this paper, optimization tools are presented to reduce the number of device sets and guidelines for their use are given.",
keywords = "Accelerated test method, dose rate, ELDRS, switching experiments, total dose",
author = "J. Boch and {Gonzalez Velo}, Yago and F. Saign{\'e} and Roche, {N. J.H.} and S. Perez and Schrimpf, {R. D.} and Vaille, {J. R.} and L. Dusseau and J. Mekki and E. Lorfevre and R. Ecoffet",
year = "2011",
month = "12",
day = "1",
doi = "10.1109/TNS.2011.2171003",
language = "English (US)",
volume = "58",
pages = "2998--3003",
journal = "IEEE Transactions on Nuclear Science",
issn = "0018-9499",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
number = "6 PART 1",

}

TY - JOUR

T1 - ELDRS

T2 - Optimization tools for the switched dose rate technique

AU - Boch, J.

AU - Gonzalez Velo, Yago

AU - Saigné, F.

AU - Roche, N. J.H.

AU - Perez, S.

AU - Schrimpf, R. D.

AU - Vaille, J. R.

AU - Dusseau, L.

AU - Mekki, J.

AU - Lorfevre, E.

AU - Ecoffet, R.

PY - 2011/12/1

Y1 - 2011/12/1

N2 - As an accelerated test to characterize bipolar devices, the switched dose rate technique is a suitable solution for obtaining the entire low dose rate curve. Several sets of devices are first irradiated at high dose rate. Subsequently, all the sets are irradiated at low dose rate at the same time, which saves a considerable amount of time. The overall low dose rate curve is reconstructed by translating the individual curves obtained at low dose rate so that they form a continuous curve. The main issue of such a technique is that it requires several sets of devices. In this paper, optimization tools are presented to reduce the number of device sets and guidelines for their use are given.

AB - As an accelerated test to characterize bipolar devices, the switched dose rate technique is a suitable solution for obtaining the entire low dose rate curve. Several sets of devices are first irradiated at high dose rate. Subsequently, all the sets are irradiated at low dose rate at the same time, which saves a considerable amount of time. The overall low dose rate curve is reconstructed by translating the individual curves obtained at low dose rate so that they form a continuous curve. The main issue of such a technique is that it requires several sets of devices. In this paper, optimization tools are presented to reduce the number of device sets and guidelines for their use are given.

KW - Accelerated test method

KW - dose rate

KW - ELDRS

KW - switching experiments

KW - total dose

UR - http://www.scopus.com/inward/record.url?scp=83855165153&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=83855165153&partnerID=8YFLogxK

U2 - 10.1109/TNS.2011.2171003

DO - 10.1109/TNS.2011.2171003

M3 - Article

VL - 58

SP - 2998

EP - 3003

JO - IEEE Transactions on Nuclear Science

JF - IEEE Transactions on Nuclear Science

SN - 0018-9499

IS - 6 PART 1

M1 - 6075297

ER -