Elastic properties of thin fcc films

F. H. Streitz, Karl Sieradzki, R. C. Cammarata

Research output: Contribution to journalArticle

45 Citations (Scopus)

Abstract

We report the results of molecular-dynamics simulations on oriented fcc thin films. For thin films of (001) orientation we found that independent of the potential, the intrinsic structural instability of these films governed their elastic properties. All of the in-plane elastic constants increase with decreasing film thickness for thin (111) films modeled with use of embedded-atom-method potentials, whereas (111) films modeled with use of a Lennard-Jones potential gave entirely opposite results.

Original languageEnglish (US)
Pages (from-to)12285-12287
Number of pages3
JournalPhysical Review B
Volume41
Issue number17
DOIs
StatePublished - 1990
Externally publishedYes

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elastic properties
Thin films
thin films
Lennard-Jones potential
embedded atom method
Elastic constants
Film thickness
Molecular dynamics
film thickness
molecular dynamics
Atoms
Computer simulation
simulation

ASJC Scopus subject areas

  • Condensed Matter Physics

Cite this

Elastic properties of thin fcc films. / Streitz, F. H.; Sieradzki, Karl; Cammarata, R. C.

In: Physical Review B, Vol. 41, No. 17, 1990, p. 12285-12287.

Research output: Contribution to journalArticle

Streitz, FH, Sieradzki, K & Cammarata, RC 1990, 'Elastic properties of thin fcc films', Physical Review B, vol. 41, no. 17, pp. 12285-12287. https://doi.org/10.1103/PhysRevB.41.12285
Streitz, F. H. ; Sieradzki, Karl ; Cammarata, R. C. / Elastic properties of thin fcc films. In: Physical Review B. 1990 ; Vol. 41, No. 17. pp. 12285-12287.
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