Efficient simulations for capacity analysis and automated material handling system design in semiconductor wafer fabs

Jesus A. Jimenez, Gerald Mackulak, John Fowler

Research output: Chapter in Book/Report/Conference proceedingConference contribution

6 Scopus citations

Abstract

The Automated Material Handling System (AMHS) must be designed effectively so that it never becomes a limiting factor for the capacity of 300mm wafer fabs. Ideally, a fully integrated fab simulation model (i.e. a model containing detailed modeling constructs for the production operations, the tools, the AMHS, and tool AMHS interactions) should be used in order to design the AMHS. However, the problem is that it takes too much time to simulate and analyze these models. Experimentation has demonstrated that certain capacity models with less detailed AMHS representations can generate accurate system predictions in comparison to the values produced by fully integrated models. Because these less detailed models run faster, we can thus assess efficiently the effects of an AMHS design configuration on equipment capacity. A case study comparing the computational efficiency and the quality of the performance predictions at different levels of detail will be presented.

Original languageEnglish (US)
Title of host publicationProceedings of the 2005 Winter Simulation Conference
Pages2157-2161
Number of pages5
DOIs
StatePublished - Dec 1 2005
Event2005 Winter Simulation Conference - Orlando, FL, United States
Duration: Dec 4 2005Dec 7 2005

Publication series

NameProceedings - Winter Simulation Conference
Volume2005
ISSN (Print)0891-7736

Other

Other2005 Winter Simulation Conference
Country/TerritoryUnited States
CityOrlando, FL
Period12/4/0512/7/05

ASJC Scopus subject areas

  • Software
  • Modeling and Simulation
  • Computer Science Applications

Fingerprint

Dive into the research topics of 'Efficient simulations for capacity analysis and automated material handling system design in semiconductor wafer fabs'. Together they form a unique fingerprint.

Cite this