Efficient modeling of PIN diode switches employing time-domain electromagnetic-physics-based simulators

Yasser A. Hussein, Samir M. El-Ghazaly, Stephen Goodnick

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations

Abstract

This paper presents an efficient full-wave time-domain simulator for accurate modeling of PIN diode switches. An equivalent circuit of the PIN diode is extracted under different bias conditions using a drift-diffusion physical model. Net recombination is modeled using a Shockley-Read-Hall process, while generation is assumed to be dominated by impact ionization. The device physics is coupled to Maxwell's equations using extended-FDTD formulism. A complete set of results is presented for the on and off states of the PIN switch. The results are validated through comparison with independent measurements, where good agreement is observed. Using this modeling approach, it is demonstrated that one can efficiently optimize PIN switches for better performance.

Original languageEnglish (US)
Title of host publication2005 IEEE MTT-S International Microwave Symposium Digest
Pages325-328
Number of pages4
DOIs
StatePublished - Dec 1 2005
Event2005 IEEE MTT-S International Microwave Symposium - Long Beach, CA, United States
Duration: Jun 12 2005Jun 17 2005

Publication series

NameIEEE MTT-S International Microwave Symposium Digest
Volume2005
ISSN (Print)0149-645X

Other

Other2005 IEEE MTT-S International Microwave Symposium
CountryUnited States
CityLong Beach, CA
Period6/12/056/17/05

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Keywords

  • Device transport physics
  • Global modeling
  • Maxwell's equations
  • PIN diode switches

ASJC Scopus subject areas

  • Radiation
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

Cite this

Hussein, Y. A., El-Ghazaly, S. M., & Goodnick, S. (2005). Efficient modeling of PIN diode switches employing time-domain electromagnetic-physics-based simulators. In 2005 IEEE MTT-S International Microwave Symposium Digest (pp. 325-328). [1516592] (IEEE MTT-S International Microwave Symposium Digest; Vol. 2005). https://doi.org/10.1109/MWSYM.2005.1516592