We present the interface diffraction method (IDM), an efficient technique to determine the response of planar photonic crystal waveguides and couplers containing arbitrary defects. Field profiles in separate regions of a structure are represented through two contrasting approaches: the plane wave expansion method in the cladding and a scattering matrix method in the core. These results are combined through boundary conditions at the interface between regions to model fully a device. In the IDM, the relevant interface properties of individual device elements can be obtained from unit cell computations, stored, and later combined with other elements as needed, resulting in calculations that are over an order of magnitude faster than supercell simulation techniques. Dispersion relations for photonic crystal waveguides obtained through the IDM agree with the conventional plane wave expansion method to within 2.2% of the stopband width.
ASJC Scopus subject areas
- Atomic and Molecular Physics, and Optics