Efficient defect detection with sign information of Walsh Hadamard transform

Qiang Zhang, Peter Van Beek, Chang Yuan, Xinyu Xu, Hae Jong Seo, Baoxin Li

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)

Abstract

We propose a method for defect detection based on taking the sign information of Walsh Hadamard Transform (WHT) coefficients. The core of the proposed algorithm involves only three steps that can all be implemented very efficiently: applying the forward WHT, taking the sign of the transform coefficients, and taking an inverse WHT using only the sign information. Our implementation takes only 7 milliseconds for a 512 × 512 image on a PC platform. As a result, the proposed method is more efficient than the PHase Only Transform (PHOT) method and other methods in literature. In addition, the proposed approach is capable of detecting defects of varying shapes, by combining the 2-dimensional WHT and 1-dimensional WHT; and can detect defects in images with strong object boundaries by utilizing a reference image. The proposed algorithm is robust over different background image patterns and varying illumination conditions. We evaluated the proposed method both visually and quantitatively and obtained good results on images from various defect detection applications.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
Volume8661
DOIs
StatePublished - 2013
EventImage Processing: Machine Vision Applications VI - Burlingame, CA, United States
Duration: Feb 5 2013Feb 6 2013

Other

OtherImage Processing: Machine Vision Applications VI
CountryUnited States
CityBurlingame, CA
Period2/5/132/6/13

Fingerprint

Walsh Transform
Walsh transforms
Hadamard Transform
Hadamard transforms
Defect Detection
defects
Defects
Transform
Coefficient
coefficients
Illumination
Lighting
Defect detection
Mathematical transformations
platforms
illumination

Keywords

  • Defect detection
  • Image signature
  • PHase only transform
  • Sign information
  • Walsh Hadamard transform

ASJC Scopus subject areas

  • Applied Mathematics
  • Computer Science Applications
  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

Cite this

Zhang, Q., Van Beek, P., Yuan, C., Xu, X., Seo, H. J., & Li, B. (2013). Efficient defect detection with sign information of Walsh Hadamard transform. In Proceedings of SPIE - The International Society for Optical Engineering (Vol. 8661). [86610A] https://doi.org/10.1117/12.2004671

Efficient defect detection with sign information of Walsh Hadamard transform. / Zhang, Qiang; Van Beek, Peter; Yuan, Chang; Xu, Xinyu; Seo, Hae Jong; Li, Baoxin.

Proceedings of SPIE - The International Society for Optical Engineering. Vol. 8661 2013. 86610A.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Zhang, Q, Van Beek, P, Yuan, C, Xu, X, Seo, HJ & Li, B 2013, Efficient defect detection with sign information of Walsh Hadamard transform. in Proceedings of SPIE - The International Society for Optical Engineering. vol. 8661, 86610A, Image Processing: Machine Vision Applications VI, Burlingame, CA, United States, 2/5/13. https://doi.org/10.1117/12.2004671
Zhang Q, Van Beek P, Yuan C, Xu X, Seo HJ, Li B. Efficient defect detection with sign information of Walsh Hadamard transform. In Proceedings of SPIE - The International Society for Optical Engineering. Vol. 8661. 2013. 86610A https://doi.org/10.1117/12.2004671
Zhang, Qiang ; Van Beek, Peter ; Yuan, Chang ; Xu, Xinyu ; Seo, Hae Jong ; Li, Baoxin. / Efficient defect detection with sign information of Walsh Hadamard transform. Proceedings of SPIE - The International Society for Optical Engineering. Vol. 8661 2013.
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