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Effects of structural defects on diode properties in 4H-SiC
Brian Skromme, K. C. Palle, M. K. Mikhov, H. Meidia, S. Mahajan, X. R. Huang, W. M. Vetter, M. Dudley, K. Moore, S. Smith, T. Gehoski
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
3
Scopus
citations