TY - JOUR
T1 - Effects of physical and chemical surface roughness on the brightness of electron beams from photocathodes
AU - Gevorkyan, G.
AU - Karkare, S.
AU - Emamian, S.
AU - Bazarov, I. V.
AU - Padmore, H. A.
N1 - Funding Information:
This work was supported by the Director, Office of Science, Office of Basic Energy Sciences of the U.S. Department of Energy, under Contracts No.KC0407-ALSJNT-I0013 and No.DE-AC02-05CH11231, and by the National Science Foundation under Grant No.Phy1549132, the Center for Bright Beams.
Funding Information:
This work was supported by the Director, Office of Science, Office of Basic Energy Sciences of the U.S. Department of Energy, under Contracts No. KC0407-ALSJNT-I0013 and No. DE-AC02-05CH11231, and by the National Science Foundation under Grant No. Phy1549132, the Center for Bright Beams.
Publisher Copyright:
© 2018 authors. Published by the American Physical Society.
PY - 2018/9/14
Y1 - 2018/9/14
N2 - The performance of free electron laser x-ray light sources, and systems for ultrafast electron diffraction and ultrafast electron microscopy, is limited by the brightness of the electron sources used. The intrinsic emittance, or equivalently, the mean transverse energy (MTE) of electrons emitted from the photocathode determines the maximum possible brightness in such systems. With ongoing improvements in photocathode design and synthesis, we are now at a point where the physical and chemical surface roughness of the cathode can become a limiting factor. Here we show how measurements of the spatially dependent variations in height and surface potential can be used to compute the electron beam mean transverse energy (MTE), one of the key determining factors in evaluation of brightness.
AB - The performance of free electron laser x-ray light sources, and systems for ultrafast electron diffraction and ultrafast electron microscopy, is limited by the brightness of the electron sources used. The intrinsic emittance, or equivalently, the mean transverse energy (MTE) of electrons emitted from the photocathode determines the maximum possible brightness in such systems. With ongoing improvements in photocathode design and synthesis, we are now at a point where the physical and chemical surface roughness of the cathode can become a limiting factor. Here we show how measurements of the spatially dependent variations in height and surface potential can be used to compute the electron beam mean transverse energy (MTE), one of the key determining factors in evaluation of brightness.
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U2 - 10.1103/PhysRevAccelBeams.21.093401
DO - 10.1103/PhysRevAccelBeams.21.093401
M3 - Article
AN - SCOPUS:85053384422
SN - 2469-9888
VL - 21
JO - Physical Review Accelerators and Beams
JF - Physical Review Accelerators and Beams
IS - 9
M1 - 092803
ER -