EFFECT OF VOLTAGE ON THE ORIENTATION DEPENDENCE OF ELECTRON INDUCED CHARACTERISTIC X-RAY EMISSIONS.

Kannan M. Krishnan; Peter Rez; Gareth Thomas

EFFECT OF VOLTAGE ON THE ORIENTATION DEPENDENCE OF ELECTRON INDUCED CHARACTERISTIC X-RAY EMISSIONS.

Kannan M. Krishnan, Peter Rez, Gareth Thomas

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

The dependence of electron induced characteristic x-ray emissions on both the orientation and the acceleration voltage for MgAl//2O//4 have been calculated. A non uniform voltage dependence, characterized by an 'inversion' voltage is predicted. The characteristic of this 'inversion' voltage is shown to be different from the conventional critical voltage effect.

Original language	English (US)
Title of host publication	Lawrence Berkeley Laboratory (Report) LBL
Editors	R.M. Fisher, R. Gronsky, K.H. Westmacott
Pages	365-370
Number of pages	6
State	Published - 1983
Externally published	Yes

ASJC Scopus subject areas

General Engineering

Cite this

@inproceedings{fe8f827766ab4d8dae01c53e4ee25f4f,

title = "EFFECT OF VOLTAGE ON THE ORIENTATION DEPENDENCE OF ELECTRON INDUCED CHARACTERISTIC X-RAY EMISSIONS.",

abstract = "The dependence of electron induced characteristic x-ray emissions on both the orientation and the acceleration voltage for MgAl//2O//4 have been calculated. A non uniform voltage dependence, characterized by an 'inversion' voltage is predicted. The characteristic of this 'inversion' voltage is shown to be different from the conventional critical voltage effect.",

author = "Krishnan, {Kannan M.} and Peter Rez and Gareth Thomas",

year = "1983",

language = "English (US)",

pages = "365--370",

editor = "R.M. Fisher and R. Gronsky and K.H. Westmacott",

booktitle = "Lawrence Berkeley Laboratory (Report) LBL",

}

TY - GEN

T1 - EFFECT OF VOLTAGE ON THE ORIENTATION DEPENDENCE OF ELECTRON INDUCED CHARACTERISTIC X-RAY EMISSIONS.

AU - Krishnan, Kannan M.

AU - Rez, Peter

AU - Thomas, Gareth

PY - 1983

Y1 - 1983

N2 - The dependence of electron induced characteristic x-ray emissions on both the orientation and the acceleration voltage for MgAl//2O//4 have been calculated. A non uniform voltage dependence, characterized by an 'inversion' voltage is predicted. The characteristic of this 'inversion' voltage is shown to be different from the conventional critical voltage effect.

AB - The dependence of electron induced characteristic x-ray emissions on both the orientation and the acceleration voltage for MgAl//2O//4 have been calculated. A non uniform voltage dependence, characterized by an 'inversion' voltage is predicted. The characteristic of this 'inversion' voltage is shown to be different from the conventional critical voltage effect.

UR - http://www.scopus.com/inward/record.url?scp=0020898896&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0020898896&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:0020898896

SP - 365

EP - 370

BT - Lawrence Berkeley Laboratory (Report) LBL

A2 - Fisher, R.M.

A2 - Gronsky, R.

A2 - Westmacott, K.H.

ER -

EFFECT OF VOLTAGE ON THE ORIENTATION DEPENDENCE OF ELECTRON INDUCED CHARACTERISTIC X-RAY EMISSIONS.

Abstract

ASJC Scopus subject areas

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