The dependence of electron induced characteristic x-ray emissions on both the orientation and the acceleration voltage for MgAl//2O//4 have been calculated. A non uniform voltage dependence, characterized by an 'inversion' voltage is predicted. The characteristic of this 'inversion' voltage is shown to be different from the conventional critical voltage effect.
|Original language||English (US)|
|Title of host publication||Lawrence Berkeley Laboratory (Report) LBL|
|Editors||R.M. Fisher, R. Gronsky, K.H. Westmacott|
|Number of pages||6|
|State||Published - 1983|
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