EFFECT OF VOLTAGE ON THE ORIENTATION DEPENDENCE OF ELECTRON INDUCED CHARACTERISTIC X-RAY EMISSIONS.

Kannan M. Krishnan, Peter Rez, Gareth Thomas

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Scopus citations

Abstract

The dependence of electron induced characteristic x-ray emissions on both the orientation and the acceleration voltage for MgAl//2O//4 have been calculated. A non uniform voltage dependence, characterized by an 'inversion' voltage is predicted. The characteristic of this 'inversion' voltage is shown to be different from the conventional critical voltage effect.

Original languageEnglish (US)
Title of host publicationLawrence Berkeley Laboratory (Report) LBL
EditorsR.M. Fisher, R. Gronsky, K.H. Westmacott
Pages365-370
Number of pages6
StatePublished - 1983
Externally publishedYes

ASJC Scopus subject areas

  • Engineering(all)

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  • Cite this

    Krishnan, K. M., Rez, P., & Thomas, G. (1983). EFFECT OF VOLTAGE ON THE ORIENTATION DEPENDENCE OF ELECTRON INDUCED CHARACTERISTIC X-RAY EMISSIONS. In R. M. Fisher, R. Gronsky, & K. H. Westmacott (Eds.), Lawrence Berkeley Laboratory (Report) LBL (pp. 365-370)