Effect of substrate orientation on terahertz optical transmission through VO2 thin films and application to functional antireflection coatings

Yanhan Zhu; Yong Zhao; Mark Holtz; Zhaoyang Fan; Ayrton A. Bernussi

doi:10.1364/JOSAB.29.002373

Effect of substrate orientation on terahertz optical transmission through VO₂ thin films and application to functional antireflection coatings

Yanhan Zhu, Yong Zhao, Mark Holtz, Zhaoyang Fan, Ayrton A. Bernussi

Research output: Contribution to journal › Article › peer-review

97 Scopus citations

Abstract

We report studies of the terahertz (THz) transmission through vanadium dioxide (VO₂) thin films grown on c-, m-, and r-plane sapphire substrates. Our results revealed THz amplitude modulation as large as 84% for VO₂ films grown on r-plane sapphire substrates upon crossing the metal-insulator phase transition temperature. Complex optical conductivity and refractive indices were determined for all investigated samples in the metallic state. Results are consistent with electrical resistivity measurements and described based on the Drude model. The real and imaginary parts of the optical conductivity and refractive index are obtained, and associations with variations in the grain morphology and crystal quality are described. We show that VO ₂ thin films can be used as tunable broadband THz frequency antireflecting coatings.

Original language	English (US)
Pages (from-to)	2373-2378
Number of pages	6
Journal	Journal of the Optical Society of America B: Optical Physics
Volume	29
Issue number	9
DOIs	https://doi.org/10.1364/JOSAB.29.002373
State	Published - Sep 1 2012
Externally published	Yes

ASJC Scopus subject areas

Statistical and Nonlinear Physics
Atomic and Molecular Physics, and Optics

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abstract = "We report studies of the terahertz (THz) transmission through vanadium dioxide (VO2) thin films grown on c-, m-, and r-plane sapphire substrates. Our results revealed THz amplitude modulation as large as 84% for VO2 films grown on r-plane sapphire substrates upon crossing the metal-insulator phase transition temperature. Complex optical conductivity and refractive indices were determined for all investigated samples in the metallic state. Results are consistent with electrical resistivity measurements and described based on the Drude model. The real and imaginary parts of the optical conductivity and refractive index are obtained, and associations with variations in the grain morphology and crystal quality are described. We show that VO 2 thin films can be used as tunable broadband THz frequency antireflecting coatings.",

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T1 - Effect of substrate orientation on terahertz optical transmission through VO2 thin films and application to functional antireflection coatings

AU - Zhu, Yanhan

AU - Zhao, Yong

AU - Holtz, Mark

AU - Fan, Zhaoyang

AU - Bernussi, Ayrton A.

PY - 2012/9/1

Y1 - 2012/9/1

N2 - We report studies of the terahertz (THz) transmission through vanadium dioxide (VO2) thin films grown on c-, m-, and r-plane sapphire substrates. Our results revealed THz amplitude modulation as large as 84% for VO2 films grown on r-plane sapphire substrates upon crossing the metal-insulator phase transition temperature. Complex optical conductivity and refractive indices were determined for all investigated samples in the metallic state. Results are consistent with electrical resistivity measurements and described based on the Drude model. The real and imaginary parts of the optical conductivity and refractive index are obtained, and associations with variations in the grain morphology and crystal quality are described. We show that VO 2 thin films can be used as tunable broadband THz frequency antireflecting coatings.

AB - We report studies of the terahertz (THz) transmission through vanadium dioxide (VO2) thin films grown on c-, m-, and r-plane sapphire substrates. Our results revealed THz amplitude modulation as large as 84% for VO2 films grown on r-plane sapphire substrates upon crossing the metal-insulator phase transition temperature. Complex optical conductivity and refractive indices were determined for all investigated samples in the metallic state. Results are consistent with electrical resistivity measurements and described based on the Drude model. The real and imaginary parts of the optical conductivity and refractive index are obtained, and associations with variations in the grain morphology and crystal quality are described. We show that VO 2 thin films can be used as tunable broadband THz frequency antireflecting coatings.

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Effect of substrate orientation on terahertz optical transmission through VO₂ thin films and application to functional antireflection coatings

Abstract

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