Effect of silicon on hot shortness

Erica E. Sampson, Sridhar Seetharaman

Research output: Contribution to journalArticlepeer-review

Abstract

Silicon additions decrease the parabolic oxidation rate, amount of separated Cu-rich liquid and grain boundary penetration. Increasing silicon content causes an increase in the interface roughness and internal oxidation but did not cause significant occlusion of Cu into the scale. Silicon additions decrease the wüstite fraction, indicating a decrease in the Fe cation diffusivity in the wüstite phase. Due to the decreased parabolic oxidation rates and formation of fayalite at the metal oxide interface but lack of significant occlusion, the mechanism behind the reduction of the Cu-rich phase for these low-Si contents is the formation of Si-oxides in the scale, impeding the transport of Fe cations, and therefore reducing oxidation of the steel and enrichment of Cu at the interface. Si-oxide formation in the scale around the wüstite grains and along the interface was identified in the Si-containing samples using SEM-EDS and XRD, which corresponds with a decrease in ion diffusion, therefore a reduction in oxidation and corresponding hot shortness.

Original languageEnglish (US)
Pages (from-to)70-79
Number of pages10
JournalIron and Steel Technology
Volume10
Issue number1
StatePublished - Jan 2013
Externally publishedYes

ASJC Scopus subject areas

  • Mechanics of Materials
  • Mechanical Engineering
  • Metals and Alloys
  • Materials Chemistry

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