Abstract
A Rutherford backscattering spectrometry (RBS) study has found that concentrations up to 7at.% of Rb and Cs can be introduced to a depth of ∼700 in MgB2 thin films by annealing in quartz ampoules containing the elemental alkali metals at <350 °C. No significant change in transition temperature (Tc) (determined resistively) was observed, in contrast to an earlier report of very high Tcs (>50K) from susceptibility measurements on MgB2 powders. The lack of a significant change in Tc and intra-granular carrier scattering suggests that Rb and Cs diffuse into the film, but do not enter the grains. Instead, the observed changes in the electrical properties, including a significant drop in J c and an increase in Δρ(ρ300- ρ40), arise from a decrease in inter-granular connectivity due to segregation of the heavy alkaline metals and other impurities (i.e.C and O) introduced into the grain boundary regions during the anneals.
Original language | English (US) |
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Article number | 025012 |
Journal | Superconductor Science and Technology |
Volume | 21 |
Issue number | 2 |
DOIs | |
State | Published - Feb 1 2008 |
ASJC Scopus subject areas
- Ceramics and Composites
- Condensed Matter Physics
- Metals and Alloys
- Electrical and Electronic Engineering
- Materials Chemistry