Effect of Proton Radiation on Ultrawide Bandgap AlN Schottky Barrier Diodes

Jossue Montes, Tsung Han Yang, Houqiang Fu, Hong Chen, Xuanqi Huang, Kai Fu, Izak Baranowski, Yuji Zhao

Research output: Contribution to journalArticlepeer-review

Abstract

Lateral Pd/n-AlN Schottky barrier diodes (SBDs) were fabricated and subjected to 3-MeV proton irradiation at various fluences. Electrical and material characterization analysis was performed before and after each radiation fluence to quantify the change in device characteristics. It was found that the SBDs performed reliably up to a proton irradiation fluence of 5 × 1013c-2, with little or no change in the key device performance, such as current, turn-on voltage, ideality factor, breakdown voltage, and so on. The electrical characteristics of the SBDs were well-predicted using a standard thermionic emission theory. The performance of the SBDs shows a significant degradation after a high-fluence irritation of $5 × 1015cm-2, where the current of the SBDs dropped two orders in magnitude. Material and surface characterizations, including atomic force microscopy and X-ray diffraction, indicated a consistent degradation in the AlN bulk crystal quality and a drastic increase in surface roughness. These results provide valuable information on the radiation properties of AlN electronics and can serve as important references for the future development of high-performance AlN devices for extreme environment applications.

Original languageEnglish (US)
Article number8554295
Pages (from-to)91-96
Number of pages6
JournalIEEE Transactions on Nuclear Science
Volume66
Issue number1
DOIs
StatePublished - Jan 2019

Keywords

  • Aluminum nitride
  • Schottky barrier diodes (SBDs)
  • barrier height
  • breakdown voltage
  • ideality factor
  • leakage current
  • radiation effects
  • surface roughness
  • turn-on voltage

ASJC Scopus subject areas

  • Nuclear and High Energy Physics
  • Nuclear Energy and Engineering
  • Electrical and Electronic Engineering

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