Abstract
Effect of deposition parameters on exchange bias was studied using Lorentz and high resolution electron microscopy. RBS revealed that the effect of annealing was a reduction in thickness in the NiO layer. High resolution electron microscopy revealed the polycrystalline nature of the bilayers in both NiMn/Py and NiO/Py systems.
Original language | English (US) |
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Title of host publication | Digests of the Intermag Conference |
State | Published - 2003 |
Event | Intermag 2003: International Magnetics Conference - Boston, MA, United States Duration: Mar 28 2003 → Apr 3 2003 |
Other
Other | Intermag 2003: International Magnetics Conference |
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Country/Territory | United States |
City | Boston, MA |
Period | 3/28/03 → 4/3/03 |
ASJC Scopus subject areas
- Electrical and Electronic Engineering