Effect of deposition parameters on exchange bias studied using lorentz and high resolution electron microscopy

B. Ramadurai, David Smith

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Effect of deposition parameters on exchange bias was studied using Lorentz and high resolution electron microscopy. RBS revealed that the effect of annealing was a reduction in thickness in the NiO layer. High resolution electron microscopy revealed the polycrystalline nature of the bilayers in both NiMn/Py and NiO/Py systems.

Original languageEnglish (US)
Title of host publicationDigests of the Intermag Conference
StatePublished - 2003
EventIntermag 2003: International Magnetics Conference - Boston, MA, United States
Duration: Mar 28 2003Apr 3 2003

Other

OtherIntermag 2003: International Magnetics Conference
CountryUnited States
CityBoston, MA
Period3/28/034/3/03

Fingerprint

High resolution electron microscopy
Annealing

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Cite this

Effect of deposition parameters on exchange bias studied using lorentz and high resolution electron microscopy. / Ramadurai, B.; Smith, David.

Digests of the Intermag Conference. 2003.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Ramadurai, B & Smith, D 2003, Effect of deposition parameters on exchange bias studied using lorentz and high resolution electron microscopy. in Digests of the Intermag Conference. Intermag 2003: International Magnetics Conference, Boston, MA, United States, 3/28/03.
@inproceedings{ed9bdb1619d94fa784d8b28687d53c94,
title = "Effect of deposition parameters on exchange bias studied using lorentz and high resolution electron microscopy",
abstract = "Effect of deposition parameters on exchange bias was studied using Lorentz and high resolution electron microscopy. RBS revealed that the effect of annealing was a reduction in thickness in the NiO layer. High resolution electron microscopy revealed the polycrystalline nature of the bilayers in both NiMn/Py and NiO/Py systems.",
author = "B. Ramadurai and David Smith",
year = "2003",
language = "English (US)",
booktitle = "Digests of the Intermag Conference",

}

TY - GEN

T1 - Effect of deposition parameters on exchange bias studied using lorentz and high resolution electron microscopy

AU - Ramadurai, B.

AU - Smith, David

PY - 2003

Y1 - 2003

N2 - Effect of deposition parameters on exchange bias was studied using Lorentz and high resolution electron microscopy. RBS revealed that the effect of annealing was a reduction in thickness in the NiO layer. High resolution electron microscopy revealed the polycrystalline nature of the bilayers in both NiMn/Py and NiO/Py systems.

AB - Effect of deposition parameters on exchange bias was studied using Lorentz and high resolution electron microscopy. RBS revealed that the effect of annealing was a reduction in thickness in the NiO layer. High resolution electron microscopy revealed the polycrystalline nature of the bilayers in both NiMn/Py and NiO/Py systems.

UR - http://www.scopus.com/inward/record.url?scp=0141676962&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0141676962&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:0141676962

BT - Digests of the Intermag Conference

ER -