Effect of deposition parameters on exchange bias studied using lorentz and high resolution electron microscopy

B. Ramadurai, David Smith

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Effect of deposition parameters on exchange bias was studied using Lorentz and high resolution electron microscopy. RBS revealed that the effect of annealing was a reduction in thickness in the NiO layer. High resolution electron microscopy revealed the polycrystalline nature of the bilayers in both NiMn/Py and NiO/Py systems.

Original languageEnglish (US)
Title of host publicationDigests of the Intermag Conference
StatePublished - 2003
EventIntermag 2003: International Magnetics Conference - Boston, MA, United States
Duration: Mar 28 2003Apr 3 2003

Other

OtherIntermag 2003: International Magnetics Conference
CountryUnited States
CityBoston, MA
Period3/28/034/3/03

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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