Fingerprint
Dive into the research topics of 'Effect of Al/N flux ratio during nucleation layer growth on the microstructure of GaN films grown by molecular-beam epitaxy'. Together they form a unique fingerprint.- Sort by
- Weight
- Alphabetically
Effect of Al/N flux ratio during nucleation layer growth on the microstructure of GaN films grown by molecular-beam epitaxy
Lin Zhou, David Smith, D. F. Storm, D. S. Katzer, S. C. Binari, B. V. Shanabrook
Research output: Contribution to journal › Article › peer-review
7
Scopus
citations