Editorial message: Special track on computer security

Giampaolo Bella, Peter Y A Ryan, Gail-Joon Ahn, Arslan Brömme, David W. Chadwick, Bruce Christianson, Nancy Durgin, Simon Foley, Cèdric Fournet, Dieter Gollmann, Stefanos Gritzalis, Peter Honeyman, Sokratis K. Katsikas, Markus Kuhn, Heiko Mantel, Chris Mitchell, David Von Oheimb, Pierangela Samarati, Vitaly Shmatikov, Kymie Tan

Research output: Contribution to journalArticle

Original languageEnglish (US)
Pages (from-to)304-305
Number of pages2
JournalUnknown Journal
Volume1
DOIs
StatePublished - 2005
Externally publishedYes

Fingerprint

Security of data

ASJC Scopus subject areas

  • Computer Science(all)

Cite this

Bella, G., Ryan, P. Y. A., Ahn, G-J., Brömme, A., Chadwick, D. W., Christianson, B., ... Tan, K. (2005). Editorial message: Special track on computer security. Unknown Journal, 1, 304-305. https://doi.org/10.1145/1066677.1066751

Editorial message : Special track on computer security. / Bella, Giampaolo; Ryan, Peter Y A; Ahn, Gail-Joon; Brömme, Arslan; Chadwick, David W.; Christianson, Bruce; Durgin, Nancy; Foley, Simon; Fournet, Cèdric; Gollmann, Dieter; Gritzalis, Stefanos; Honeyman, Peter; Katsikas, Sokratis K.; Kuhn, Markus; Mantel, Heiko; Mitchell, Chris; Von Oheimb, David; Samarati, Pierangela; Shmatikov, Vitaly; Tan, Kymie.

In: Unknown Journal, Vol. 1, 2005, p. 304-305.

Research output: Contribution to journalArticle

Bella, G, Ryan, PYA, Ahn, G-J, Brömme, A, Chadwick, DW, Christianson, B, Durgin, N, Foley, S, Fournet, C, Gollmann, D, Gritzalis, S, Honeyman, P, Katsikas, SK, Kuhn, M, Mantel, H, Mitchell, C, Von Oheimb, D, Samarati, P, Shmatikov, V & Tan, K 2005, 'Editorial message: Special track on computer security', Unknown Journal, vol. 1, pp. 304-305. https://doi.org/10.1145/1066677.1066751
Bella G, Ryan PYA, Ahn G-J, Brömme A, Chadwick DW, Christianson B et al. Editorial message: Special track on computer security. Unknown Journal. 2005;1:304-305. https://doi.org/10.1145/1066677.1066751
Bella, Giampaolo ; Ryan, Peter Y A ; Ahn, Gail-Joon ; Brömme, Arslan ; Chadwick, David W. ; Christianson, Bruce ; Durgin, Nancy ; Foley, Simon ; Fournet, Cèdric ; Gollmann, Dieter ; Gritzalis, Stefanos ; Honeyman, Peter ; Katsikas, Sokratis K. ; Kuhn, Markus ; Mantel, Heiko ; Mitchell, Chris ; Von Oheimb, David ; Samarati, Pierangela ; Shmatikov, Vitaly ; Tan, Kymie. / Editorial message : Special track on computer security. In: Unknown Journal. 2005 ; Vol. 1. pp. 304-305.
@article{73e1035cae8b4f8c84c9d584ecf9a52f,
title = "Editorial message: Special track on computer security",
author = "Giampaolo Bella and Ryan, {Peter Y A} and Gail-Joon Ahn and Arslan Br{\"o}mme and Chadwick, {David W.} and Bruce Christianson and Nancy Durgin and Simon Foley and C{\`e}dric Fournet and Dieter Gollmann and Stefanos Gritzalis and Peter Honeyman and Katsikas, {Sokratis K.} and Markus Kuhn and Heiko Mantel and Chris Mitchell and {Von Oheimb}, David and Pierangela Samarati and Vitaly Shmatikov and Kymie Tan",
year = "2005",
doi = "10.1145/1066677.1066751",
language = "English (US)",
volume = "1",
pages = "304--305",
journal = "Scanning Electron Microscopy",
issn = "0586-5581",
publisher = "Scanning Microscopy International",

}

TY - JOUR

T1 - Editorial message

T2 - Special track on computer security

AU - Bella, Giampaolo

AU - Ryan, Peter Y A

AU - Ahn, Gail-Joon

AU - Brömme, Arslan

AU - Chadwick, David W.

AU - Christianson, Bruce

AU - Durgin, Nancy

AU - Foley, Simon

AU - Fournet, Cèdric

AU - Gollmann, Dieter

AU - Gritzalis, Stefanos

AU - Honeyman, Peter

AU - Katsikas, Sokratis K.

AU - Kuhn, Markus

AU - Mantel, Heiko

AU - Mitchell, Chris

AU - Von Oheimb, David

AU - Samarati, Pierangela

AU - Shmatikov, Vitaly

AU - Tan, Kymie

PY - 2005

Y1 - 2005

UR - http://www.scopus.com/inward/record.url?scp=33644539490&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=33644539490&partnerID=8YFLogxK

U2 - 10.1145/1066677.1066751

DO - 10.1145/1066677.1066751

M3 - Article

AN - SCOPUS:33644539490

VL - 1

SP - 304

EP - 305

JO - Scanning Electron Microscopy

JF - Scanning Electron Microscopy

SN - 0586-5581

ER -