Dynamics of In cluster growth during InP(110) surface dissociation studied by in-situ reflection electron microscopy

M. Gajdardziska-Josifovska, M. H. Malay, David Smith

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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Abstract

Annealing effects on InP (110) surfaces were observed in situ using a modified ultrahigh-vacuum transmission electron microscope equipped with a specimen heating holder. Reflection electron microscopy (REM) was used to record the dynamics of nucleation and growth of liquid In clusters at 650°C, following the desorption of P from the surface. These droplets showed no preference for nucleation at surface steps, and the steps appeared stationary throughout the annealing process. Two distinct types of In cluster growth rates and shape evolutions were detected. A model was developed to decouple height and length information in the REM images. Contact angle and volume above the InP(110) surface were calculated from the dynamic data. The change of contact angle with time provides evidence for sub-surface cluster etching.

Original languageEnglish (US)
Title of host publicationMaterials Research Society Symposium Proceedings
Pages143-148
Number of pages6
Volume404
Publication statusPublished - 1996
Externally publishedYes
EventProceedings of the 1995 MRS Fall Meeting - Boston, MA, USA
Duration: Nov 26 1995Dec 1 1995

Other

OtherProceedings of the 1995 MRS Fall Meeting
CityBoston, MA, USA
Period11/26/9512/1/95

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ASJC Scopus subject areas

  • Engineering(all)

Cite this

Gajdardziska-Josifovska, M., Malay, M. H., & Smith, D. (1996). Dynamics of In cluster growth during InP(110) surface dissociation studied by in-situ reflection electron microscopy. In Materials Research Society Symposium Proceedings (Vol. 404, pp. 143-148)