Dynamic random testing with parameter adjustment

Zijiang Yang, Beibei Yin, Junpeng Lv, Kaiyuan Cai, Sik-Sang Yau, Jia Yu

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Scopus citations

Abstract

In order to improve traditional Random Partition Testing (RPT) strategy, Dynamic Random Testing (DRT) strategy is proposed. By DRT, testing profile is dynamically updated according to the previous test case execution result. The effectiveness of DRT depends on parameter settings. In this paper, a strategy is presented for extending the DRT with parameter adjustment in order to guarantee that the optimized boundaries. Using this strategy, the parameters in DRT are adjusted based on testing history during testing process. Case studies are presented and analyzed to show the improvement of DRT.

Original languageEnglish (US)
Title of host publicationProceedings - IEEE 38th Annual International Computers, Software and Applications Conference Workshops, COMPSACW 2014
EditorsCristina Seceleanu, Bruce McMillin, Carl K. Chang, Yan Gao, Kenichi Yoshida, Ali Hurson, Yasuo Okabe, Mihhail Matskin
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages37-42
Number of pages6
ISBN (Electronic)9781479935789
DOIs
StatePublished - Sep 18 2014
Event38th Annual IEEE Computer Software and Applications Conference Workshops, COMPSACW 2014 - Vasteras, Sweden
Duration: Jul 27 2014Jul 29 2014

Publication series

NameProceedings - IEEE 38th Annual International Computers, Software and Applications Conference Workshops, COMPSACW 2014

Other

Other38th Annual IEEE Computer Software and Applications Conference Workshops, COMPSACW 2014
CountrySweden
CityVasteras
Period7/27/147/29/14

Keywords

  • adjusted dynamic random testing
  • dynamic random testing
  • software testing

ASJC Scopus subject areas

  • Computer Science Applications
  • Software

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  • Cite this

    Yang, Z., Yin, B., Lv, J., Cai, K., Yau, S-S., & Yu, J. (2014). Dynamic random testing with parameter adjustment. In C. Seceleanu, B. McMillin, C. K. Chang, Y. Gao, K. Yoshida, A. Hurson, Y. Okabe, & M. Matskin (Eds.), Proceedings - IEEE 38th Annual International Computers, Software and Applications Conference Workshops, COMPSACW 2014 (pp. 37-42). [6903102] (Proceedings - IEEE 38th Annual International Computers, Software and Applications Conference Workshops, COMPSACW 2014). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/COMPSACW.2014.10