Dynamic random testing with parameter adjustment

Zijiang Yang; Beibei Yin; Junpeng Lv; Kaiyuan Cai; Sik-Sang Yau; Jia Yu

doi:10.1109/COMPSACW.2014.10

Dynamic random testing with parameter adjustment

Zijiang Yang, Beibei Yin, Junpeng Lv, Kaiyuan Cai, Sik-Sang Yau, Jia Yu

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

6 Scopus citations

Abstract

In order to improve traditional Random Partition Testing (RPT) strategy, Dynamic Random Testing (DRT) strategy is proposed. By DRT, testing profile is dynamically updated according to the previous test case execution result. The effectiveness of DRT depends on parameter settings. In this paper, a strategy is presented for extending the DRT with parameter adjustment in order to guarantee that the optimized boundaries. Using this strategy, the parameters in DRT are adjusted based on testing history during testing process. Case studies are presented and analyzed to show the improvement of DRT.

Original language	English (US)
Title of host publication	Proceedings - IEEE 38th Annual International Computers, Software and Applications Conference Workshops, COMPSACW 2014
Editors	Cristina Seceleanu, Bruce McMillin, Carl K. Chang, Yan Gao, Kenichi Yoshida, Ali Hurson, Yasuo Okabe, Mihhail Matskin
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	37-42
Number of pages	6
ISBN (Electronic)	9781479935789
DOIs	https://doi.org/10.1109/COMPSACW.2014.10
State	Published - Sep 18 2014
Event	38th Annual IEEE Computer Software and Applications Conference Workshops, COMPSACW 2014 - Vasteras, Sweden Duration: Jul 27 2014 → Jul 29 2014

Publication series

Name	Proceedings - IEEE 38th Annual International Computers, Software and Applications Conference Workshops, COMPSACW 2014

Other

Other	38th Annual IEEE Computer Software and Applications Conference Workshops, COMPSACW 2014
Country/Territory	Sweden
City	Vasteras
Period	7/27/14 → 7/29/14

Keywords

adjusted dynamic random testing
dynamic random testing
software testing

ASJC Scopus subject areas

Computer Science Applications
Software

Access to Document

10.1109/COMPSACW.2014.10

Cite this

Yang, Z., Yin, B., Lv, J., Cai, K., Yau, S-S., & Yu, J. (2014). Dynamic random testing with parameter adjustment. In C. Seceleanu, B. McMillin, C. K. Chang, Y. Gao, K. Yoshida, A. Hurson, Y. Okabe, & M. Matskin (Eds.), Proceedings - IEEE 38th Annual International Computers, Software and Applications Conference Workshops, COMPSACW 2014 (pp. 37-42). [6903102] (Proceedings - IEEE 38th Annual International Computers, Software and Applications Conference Workshops, COMPSACW 2014). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/COMPSACW.2014.10

Dynamic random testing with parameter adjustment. / Yang, Zijiang; Yin, Beibei; Lv, Junpeng; Cai, Kaiyuan; Yau, Sik-Sang; Yu, Jia.

Proceedings - IEEE 38th Annual International Computers, Software and Applications Conference Workshops, COMPSACW 2014. ed. / Cristina Seceleanu; Bruce McMillin; Carl K. Chang; Yan Gao; Kenichi Yoshida; Ali Hurson; Yasuo Okabe; Mihhail Matskin. Institute of Electrical and Electronics Engineers Inc., 2014. p. 37-42 6903102 (Proceedings - IEEE 38th Annual International Computers, Software and Applications Conference Workshops, COMPSACW 2014).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Yang, Z, Yin, B, Lv, J, Cai, K, Yau, S-S & Yu, J 2014, Dynamic random testing with parameter adjustment. in C Seceleanu, B McMillin, CK Chang, Y Gao, K Yoshida, A Hurson, Y Okabe & M Matskin (eds), Proceedings - IEEE 38th Annual International Computers, Software and Applications Conference Workshops, COMPSACW 2014., 6903102, Proceedings - IEEE 38th Annual International Computers, Software and Applications Conference Workshops, COMPSACW 2014, Institute of Electrical and Electronics Engineers Inc., pp. 37-42, 38th Annual IEEE Computer Software and Applications Conference Workshops, COMPSACW 2014, Vasteras, Sweden, 7/27/14. https://doi.org/10.1109/COMPSACW.2014.10

Yang Z, Yin B, Lv J, Cai K, Yau S-S, Yu J. Dynamic random testing with parameter adjustment. In Seceleanu C, McMillin B, Chang CK, Gao Y, Yoshida K, Hurson A, Okabe Y, Matskin M, editors, Proceedings - IEEE 38th Annual International Computers, Software and Applications Conference Workshops, COMPSACW 2014. Institute of Electrical and Electronics Engineers Inc. 2014. p. 37-42. 6903102. (Proceedings - IEEE 38th Annual International Computers, Software and Applications Conference Workshops, COMPSACW 2014). https://doi.org/10.1109/COMPSACW.2014.10

Yang, Zijiang ; Yin, Beibei ; Lv, Junpeng ; Cai, Kaiyuan ; Yau, Sik-Sang ; Yu, Jia. / Dynamic random testing with parameter adjustment. Proceedings - IEEE 38th Annual International Computers, Software and Applications Conference Workshops, COMPSACW 2014. editor / Cristina Seceleanu ; Bruce McMillin ; Carl K. Chang ; Yan Gao ; Kenichi Yoshida ; Ali Hurson ; Yasuo Okabe ; Mihhail Matskin. Institute of Electrical and Electronics Engineers Inc., 2014. pp. 37-42 (Proceedings - IEEE 38th Annual International Computers, Software and Applications Conference Workshops, COMPSACW 2014).

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abstract = "In order to improve traditional Random Partition Testing (RPT) strategy, Dynamic Random Testing (DRT) strategy is proposed. By DRT, testing profile is dynamically updated according to the previous test case execution result. The effectiveness of DRT depends on parameter settings. In this paper, a strategy is presented for extending the DRT with parameter adjustment in order to guarantee that the optimized boundaries. Using this strategy, the parameters in DRT are adjusted based on testing history during testing process. Case studies are presented and analyzed to show the improvement of DRT.",

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ER -

Dynamic random testing with parameter adjustment

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