Dynamic element matching with signal-independent element transition rates for multibit ΔΣ modulators

Arindam Sanyal, Long Chen, Nan Sun

Research output: Contribution to journalArticlepeer-review

26 Scopus citations

Abstract

This paper presents a novel dynamic element matching (DEM) technique for multi-bit ΔΣ digital-to-analog converters (DACs). The proposed technique can address errors due to both static element mismatch and dynamic inter-symbol-interference (ISI). The proposed technique ensures no ISI-induced distortion even at large signal amplitudes by de-correlating the instantaneous number of DAC transitions from the signal. It can shape the total number of transitions and whiten the individual transition sequence, thereby significantly reducing the in-band ISI errors. The proposed technique can be easily extended to higher-order shaping for both static mismatch and ISI errors. An efficient hardware implementation based on the vector-quantizer mismatch shaping framework is also presented. Simulation results show that the proposed technique can significantly improve DAC linearity in presence of both static mismatch and dynamic ISI errors.

Original languageEnglish (US)
Article number7080929
Pages (from-to)1325-1334
Number of pages10
JournalIEEE Transactions on Circuits and Systems I: Regular Papers
Volume62
Issue number5
DOIs
StatePublished - May 1 2015
Externally publishedYes

Keywords

  • Analog-to-digital converter (ADC)
  • device mismatch
  • digital-to-analog converter (DAC)
  • dynamic element matching
  • dynamic error
  • inter-symbol interference (ISI)
  • mismatch shaping
  • thermometer coding
  • ΔΣ modulator

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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